INFRARED DEVICE
An infrared device comprises a substrate (1). A configuration (3) for one of absorbing and emitting infrared radiation is supported by the substrate (1). The configuration (3) comprises an electrically conducting layer arrangement (31) of less than 50 nm thickness between dielectric layers (34,35)....
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| Main Authors | , |
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| Format | Patent |
| Language | English French German |
| Published |
03.04.2019
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| Subjects | |
| Online Access | Get full text |
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| Abstract | An infrared device comprises a substrate (1). A configuration (3) for one of absorbing and emitting infrared radiation is supported by the substrate (1). The configuration (3) comprises an electrically conducting layer arrangement (31) of less than 50 nm thickness between dielectric layers (34,35). In addition, one or more of a thermal sensor (5) arranged for sensing the infrared radiation absorbed by the configuration (3), and a heater (7) arranged for heating the configuration (3) to emit the infrared radiation is supported by the substrate (1) |
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| AbstractList | An infrared device comprises a substrate (1). A configuration (3) for one of absorbing and emitting infrared radiation is supported by the substrate (1). The configuration (3) comprises an electrically conducting layer arrangement (31) of less than 50 nm thickness between dielectric layers (34,35). In addition, one or more of a thermal sensor (5) arranged for sensing the infrared radiation absorbed by the configuration (3), and a heater (7) arranged for heating the configuration (3) to emit the infrared radiation is supported by the substrate (1) |
| Author | Winger, Martin Zäch, Nicolas |
| Author_xml | – fullname: Zäch, Nicolas – fullname: Winger, Martin |
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| DocumentTitleAlternate | DISPOSITIF INFRAROUGE INFRAROTVORRICHTUNG |
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| Notes | Application Number: EP20170193760 |
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| PublicationDateYYYYMMDD | 2019-04-03 |
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| PublicationYear | 2019 |
| RelatedCompanies | Sensirion AG |
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| Snippet | An infrared device comprises a substrate (1). A configuration (3) for one of absorbing and emitting infrared radiation is supported by the substrate (1). The... |
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| SubjectTerms | BASIC ELECTRIC ELEMENTS COLORIMETRY ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT MEASURING PHYSICS RADIATION PYROMETRY SEMICONDUCTOR DEVICES TESTING |
| Title | INFRARED DEVICE |
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