METHOD AND X-RAY INSPECTION SYSTEM, IN PARTICULAR FOR NON-DESTRUCTIVELY INSPECTING OBJECTS

• Main Authors: NAUMANN, Dirk, NITTIKOWSKI, Jörg, MADER, Andreas, KÖNIG, Sebastian, DREISEITEL, Pia
• Format: Patent
• Language: English; French; German
• Published: 24.02.2021
• Subjects: DETECTING MASSES OR OBJECTS; GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; MEASURING; PHYSICS; TESTING

This disclosure relates to methods for non-destructively inspecting an object, wherein electromagnetic radiation is passed through the object and intensity values of unabsorbed beams are measured and evaluated. The method can include generating a three-dimensional data set in which a first material property of the object is associated with individual spatial elements of the object using computed tomography; determining an inspection space, in the three-dimensional data set; deriving values, based on the three-dimensional data set, corresponding to a spatial geometric quantity of the inspection space in a predetermined projection direction; generating a two-dimensional data set in which a second material property of the object is associated with individual surface elements of the object, using two-dimensional X-ray; determining an inspection region in the two-dimensional data set by computing a projection of the inspection space into the two-dimensional data set; and transferring the derived values into corresponding surface elements of the projection.