Reducing MEMS stiction by deposition of nanoclusters

A method for reducing stiction in a MEMS device by decreasing surface area between two surfaces that can come into close contact is provided. Reduction in contact surface area is achieved by increasing surface roughness of one or both of the surfaces. The increased roughness is provided by forming a...

Full description

Saved in:
Bibliographic Details
Main Authors STEIMLE, ROBERT F, MONTEZ, RUBEN B
Format Patent
LanguageEnglish
French
German
Published 28.09.2016
Subjects
Online AccessGet full text

Cover

Loading…
Abstract A method for reducing stiction in a MEMS device by decreasing surface area between two surfaces that can come into close contact is provided. Reduction in contact surface area is achieved by increasing surface roughness of one or both of the surfaces. The increased roughness is provided by forming a micro-masking layer on a sacrificial layer used in formation of the MEMS device, and then etching the surface of the sacrificial layer. The micro-masking layer can be formed using nanoclusters (520). When a next portion of the MEMS device is formed on the sacrificial layer (810), this portion will take on the roughness characteristics imparted on the sacrificial layer by the etch process. The rougher surface (910) decreases the surface area available for contact in the MEMS device and, in turn, decreases the area through which stiction can be imparted.
AbstractList A method for reducing stiction in a MEMS device by decreasing surface area between two surfaces that can come into close contact is provided. Reduction in contact surface area is achieved by increasing surface roughness of one or both of the surfaces. The increased roughness is provided by forming a micro-masking layer on a sacrificial layer used in formation of the MEMS device, and then etching the surface of the sacrificial layer. The micro-masking layer can be formed using nanoclusters (520). When a next portion of the MEMS device is formed on the sacrificial layer (810), this portion will take on the roughness characteristics imparted on the sacrificial layer by the etch process. The rougher surface (910) decreases the surface area available for contact in the MEMS device and, in turn, decreases the area through which stiction can be imparted.
Author STEIMLE, ROBERT F
MONTEZ, RUBEN B
Author_xml – fullname: STEIMLE, ROBERT F
– fullname: MONTEZ, RUBEN B
BookMark eNrjYmDJy89L5WQwCUpNKU3OzEtX8HX1DVYoLslMLsnMz1NIqlRISS3IL84E8_LTFPIS8_KTc0qLS1KLinkYWNMSc4pTeaE0N4OCm2uIs4cuUEd8anFBYnJqXmpJvGuAkbmJmZGhhZOhMRFKAMHLLh4
ContentType Patent
DBID EVB
DatabaseName esp@cenet
DatabaseTitleList
Database_xml – sequence: 1
  dbid: EVB
  name: esp@cenet
  url: http://worldwide.espacenet.com/singleLineSearch?locale=en_EP
  sourceTypes: Open Access Repository
DeliveryMethod fulltext_linktorsrc
Discipline Medicine
Chemistry
Sciences
Physics
DocumentTitleAlternate Réduction du collage dans les MEMS par dépôt de nano-agrégats
Reduzierung der Haftung in MEMS durch ablagerung von Nanoclustern
ExternalDocumentID EP2746218B1
GroupedDBID EVB
ID FETCH-epo_espacenet_EP2746218B13
IEDL.DBID EVB
IngestDate Fri Jul 19 16:48:48 EDT 2024
IsOpenAccess true
IsPeerReviewed false
IsScholarly false
Language English
French
German
LinkModel DirectLink
MergedId FETCHMERGED-epo_espacenet_EP2746218B13
Notes Application Number: EP20130196317
OpenAccessLink https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20160928&DB=EPODOC&CC=EP&NR=2746218B1
ParticipantIDs epo_espacenet_EP2746218B1
PublicationCentury 2000
PublicationDate 20160928
PublicationDateYYYYMMDD 2016-09-28
PublicationDate_xml – month: 09
  year: 2016
  text: 20160928
  day: 28
PublicationDecade 2010
PublicationYear 2016
RelatedCompanies FREESCALE SEMICONDUCTOR, INC
RelatedCompanies_xml – name: FREESCALE SEMICONDUCTOR, INC
Score 3.0507138
Snippet A method for reducing stiction in a MEMS device by decreasing surface area between two surfaces that can come into close contact is provided. Reduction in...
SourceID epo
SourceType Open Access Repository
SubjectTerms INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT
MEASURING
MEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION,OR SHOCK
MICROSTRUCTURAL DEVICES OR SYSTEMS, e.g. MICROMECHANICALDEVICES
MICROSTRUCTURAL TECHNOLOGY
PERFORMING OPERATIONS
PHYSICS
PROCESSES OR APPARATUS SPECIALLY ADAPTED FOR THE MANUFACTUREOR TREATMENT OF MICROSTRUCTURAL DEVICES OR SYSTEMS
TESTING
TRANSPORTING
Title Reducing MEMS stiction by deposition of nanoclusters
URI https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20160928&DB=EPODOC&locale=&CC=EP&NR=2746218B1
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV1bS8MwFD6MeX3TqThv5EH6VpxNljUPRehlDKHbmFP2NtokhYG0w3aI_96Tsk5f9C0kISQHvnw5yTlfAO45SzVnvcSWmVY2MlTPFkILW7tiQBPlCi7Ni2485qNX9rzoL1qwanJhap3Qz1ocERElEe9VvV-vfy6xwjq2snxIV1hVPA3nXmhtveNH3hOOa4W-F00n4SSwggBL1njmofPFkc18dJT28BQ9MGCI3nyTlLL-zSjDE9if4mB5dQotnXfgKGg-XuvAYbx97-7AQR2gKUus3IKwPAM2M3KrSDkkjuIXYoSWzYRJ-kWUboKwSJGRPMkL-b4xUgjlOZBhNA9GNvZY7ha9jKa7KdMLaOdFri-BoMOROUgqKaOKJZS7KnOEkplgvK8opV3o_jnM1T9t13BsrGcCIRz3BtrVx0bfIttW6V1tp28M-4OY
link.rule.ids 230,309,783,888,25576,76882
linkProvider European Patent Office
linkToHtml http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV3PS8MwFH6M-WPetCqbP3OQ3oqzyWJzGMLajqnrNuaU3UbbpDCQdtgO8b_3pazTi95CEkLy4OXLl7x8D-CGs0hx1g6tOFHSQoRqW0IoYSlH3NNQOoLH-kU3GPHBK3uad-Y1WFZ_YUqd0M9SHBE9KkZ_L8r9evVzieWVsZX5bbTEquyhP-t65oYd3_G2sB3T63X9ydgbu6brYskcTbtIvjiiWQ-J0g6esB2d7MB_6-lPKavfiNI_hN0JDpYWR1BTqQENt0q8ZsB-sHnvNmCvDNCMc6zcOGF-DGyq5VYRckjgBy9ECy3rCZPoi0hVBWGRLCFpmGbx-1pLIeQnQPr-zB1Y2GOxXfTCn2ynTE-hnmapagJBwpHYCCoRo5KFlDsysYWME8F4R1JKW9D6c5izf9quoTGYBcPF8HH0fA4H2pI6KMJ2LqBefKzVJSJvEV2VNvsGYCuGiA
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Apatent&rft.title=Reducing+MEMS+stiction+by+deposition+of+nanoclusters&rft.inventor=STEIMLE%2C+ROBERT+F&rft.inventor=MONTEZ%2C+RUBEN+B&rft.date=2016-09-28&rft.externalDBID=B1&rft.externalDocID=EP2746218B1