Three-dimensional shape measuring apparatus and control method thereof
An exposure amount of at least one or more first patterns used to determine positions at the time of triangulation is set to be larger than that of other patterns, so as to reduce the influence of shot noise in the first patterns, to improve precision, and to reduce power consumption as a whole. To...
Saved in:
Main Authors | , |
---|---|
Format | Patent |
Language | English French German |
Published |
18.06.2014
|
Subjects | |
Online Access | Get full text |
Cover
Loading…
Summary: | An exposure amount of at least one or more first patterns used to determine positions at the time of triangulation is set to be larger than that of other patterns, so as to reduce the influence of shot noise in the first patterns, to improve precision, and to reduce power consumption as a whole. To this end, a three-dimensional shape measuring apparatus, which measures a three-dimensional shape of an object to be measured by projecting pattern light of a plurality of types of patterns onto the object to be measured, and capturing images of the object to be measured, controls a projector unit and image capture unit to set an exposure amount of the first patterns to be larger than that of patterns other than the first patterns. |
---|---|
Bibliography: | Application Number: EP20130196610 |