HIGH PERFORMANCE ARCHITECTURE FOR PROCESS TRANSMITTERS

• Main Authors: SCHULTE, JOHN, P, KLEVEN, LOWELL, A
• Format: Patent
• Language: English; French; German
• Published: 16.11.2016
• Subjects: ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS; MEASURING; MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR; PHYSICS; TARIFF METERING APPARATUS; TESTING