APPARATUSES, SYSTEMS, AND METHODS FOR LOW-COHERENCE INTERFEROMETRY (LCI)

• Main Authors: WAX, Adam, BROWN, William, J
• Format: Patent
• Language: English; French; German
• Published: 26.05.2010
• Subjects: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASURING; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS; PHYSICS; TESTING

Embodiments described herein involve low-coherence interferometry (LCI) techniques which enable acquisition of structural and depth information regarding a sample of interest. In one embodiment, a "swept-source" (SS) light source is used in LCI to obtain structural and depth information about a sample. The swept-source light source can be used to generate a reference signal and a signal directed towards a sample. Light scattered from the sample is returned as a result and mixed with the reference signal to achieve interference and thus provide structural information regarding the sample. Depth information about the sample can be obtained using Fourier domain concepts as well as time domain techniques. Several LCI embodiments employing a swept-source light source are disclosed herein. In another embodiment disclosed herein, an a/LCI system and method is provided that is based on a time domain system and employs a broadband light source. The systems and processes disclosed herein can be used for biomedical applications, including measuring cellular morphology in tissues and in vitro as well as diagnosing intraepithelial neoplasia, and assessing the efficacy of chemopreventive and chemotherapeutic agents.