Automatic analyzer

• Main Authors: NAKANO, TOSHIRO, OTAKE, HITOSHI
• Format: Patent
• Language: English; French; German
• Published: 27.05.2015
• Subjects: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASURING; PHYSICS; TESTING

An object of the present invention is to provide an automatic analyzer that is capable of easily displaying a result display screen targeted by a user, that enables the user to perform all confirmation/verification work of the measurement result acquired up to that time on a screen, and that is capa...