BOUNDARY SCAN CIRCUIT WITH INTEGRATED SENSOR FOR SENSING PHYSICAL OPERATING PARAMETERS

• Main Authors: DE JONG, FRANCISCUS, G., M, SCHUTTERT, RODGER, F
• Format: Patent
• Language: English; French; German
• Published: 02.11.2005
• Edition: 7
• Subjects: MEASURING; MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES; PHYSICS; TESTING

An integrated circuit device has boundary scan structure coupled between a test input and the test output. The test register structure is used to shift information from the test input to a test output. The test shift register structure contains a data shift part coupled to connections for a function...