Method of manufacturing a bipolar transistor using a sacrificial sidewall spacer
A method is disclosed for forming a spacer, wherein said formation is preferably performed in a single dry etch sequence in a single dry etch tool. In this single dry etch sequence subsequently polysilicon spacers are defined, used as an etch mask and removed. Said etch sequence comprises at least o...
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Main Authors | , , |
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Format | Patent |
Language | English French German |
Published |
20.10.1999
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Edition | 6 |
Subjects | |
Online Access | Get full text |
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