Apparatus for inspecting a structure comprising a probe to be inserted through a gap in the structure

• Main Authors: TOGASHI, NORIHITO, MIZUNO, SUEYOSHI, IRIE, SATOSHI, MURAKAMI, SHIN, SOTODATE, MASANORI, ZAITSU, KATSUNE, TAKAHASHI, SHINJI, KOBAYASHI, YOSHIKATA, SHIMADA, HIDEYUKI, MUNAKATA, TADASHI, SUZUKI, SATOSHI
• Format: Patent
• Language: English; French; German
• Published: 10.09.1997
• Edition: 6
• Subjects: BLASTING; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER; DYNAMO-ELECTRIC MACHINES; ELECTRICITY; ENGINEERING ELEMENTS AND UNITS; GEARING; GENERAL MEASURES FOR PRODUCING AND MAINTAINING EFFECTIVEFUNCTIONING OF MACHINES OR INSTALLATIONS; GENERATION; HEATING; INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; LIGHTING; MEASURING; MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES; MECHANICAL ENGINEERING; PHYSICS; TESTING; TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES; TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR; THERMAL INSULATION IN GENERAL; WEAPONS

The inspection apparatus for inspecting performance of a structure such as stator windings of a electric rotating machine of the invention comprises a probe including a measuring element, an arm unit and a cylinder face circumferential moving apparatus. The arm unit has an arm link section supportin...