Speichertestgerät
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Main Author | |
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Format | Patent |
Language | German |
Published |
18.03.1999
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Edition | 6 |
Subjects | |
Online Access | Get full text |
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Author | GOISHI, MASARU, MEIWA, GUNMA, JP |
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Author_xml | – fullname: GOISHI, MASARU, MEIWA, GUNMA, JP |
BookMark | eNrjYmDJy89L5WQQCi5IzUzOSC0qSS0uSU8tOrykhIeBNS0xpziVF0pzMyi5uYY4e-imFuTHpxYXJCan5qWWxLu4GlqaWxiaGRqGhBgaE6UIAGhcI4k |
ContentType | Patent |
DBID | EVB |
DatabaseName | esp@cenet |
Database_xml | – sequence: 1 dbid: EVB name: esp@cenet url: http://worldwide.espacenet.com/singleLineSearch?locale=en_EP sourceTypes: Open Access Repository |
DeliveryMethod | fulltext_linktorsrc |
Discipline | Medicine Chemistry Sciences Physics |
Edition | 6 |
ExternalDocumentID | DE19781611TT1 |
GroupedDBID | EVB |
ID | FETCH-epo_espacenet_DE19781611TT13 |
IEDL.DBID | EVB |
IngestDate | Fri Jul 19 11:32:33 EDT 2024 |
IsOpenAccess | true |
IsPeerReviewed | false |
IsScholarly | false |
Language | German |
LinkModel | DirectLink |
MergedId | FETCHMERGED-epo_espacenet_DE19781611TT13 |
Notes | Application Number: DE1997181611T |
OpenAccessLink | https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=19990318&DB=EPODOC&CC=DE&NR=19781611T1 |
ParticipantIDs | epo_espacenet_DE19781611TT1 |
PublicationCentury | 1900 |
PublicationDate | 19990318 |
PublicationDateYYYYMMDD | 1999-03-18 |
PublicationDate_xml | – month: 03 year: 1999 text: 19990318 day: 18 |
PublicationDecade | 1990 |
PublicationYear | 1999 |
RelatedCompanies | ADVANTEST CORP., TOKIO/TOKYO, JP |
RelatedCompanies_xml | – name: ADVANTEST CORP., TOKIO/TOKYO, JP |
Score | 2.4726317 |
SourceID | epo |
SourceType | Open Access Repository |
SubjectTerms | INFORMATION STORAGE MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS STATIC STORES TESTING |
Title | Speichertestgerät |
URI | https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=19990318&DB=EPODOC&locale=&CC=DE&NR=19781611T1 |
hasFullText | 1 |
inHoldings | 1 |
isFullTextHit | |
isPrint | |
link | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwY2BQMU9OSkxKTDPWtTSxNNE1SUlL1U1KsbTUBfbbgF0i8yQzM_Bgjq-fmUeoiVeEaQQTQxZsLwz4nNBy8OGIwByVDMzvJeDyugAxiOUCXltZrJ-UCRTKt3cLsXVRS4FuF7MEpVE1Fydb1wB_F39nNWdnWxdXNb8goJy5BbBxYxgC7CmxgprRoHP2XcOcQLtSCpCrFDdBBrYAoGl5JUIMTCmpwgyczrCb14QZOHyhE97CDOzgFZrJxUBBaC4sFmEQCi5IBa3gLAI2E0vSU4sOLykRZVBycw1x9tAFWhMP91O8iyvcRSGGxmIMLMDOfqoEg0IKsMGfYppibpycZAlsqZhZpKaZA1t0KZYGRimJxmbmkgzSeAySwisrzcAFOXTAWNfQQoaBpaSoNFUWWKWWJMmBwwIAsyh6Kw |
link.rule.ids | 230,309,786,891,25594,76906 |
linkProvider | European Patent Office |
linkToHtml | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwY2BQMU9OSkxKTDPWtTSxNNE1SUlL1U1KsbTUBfbbgF0i8yQzM_Bgjq-fmUeoiVeEaQQTQxZsLwz4nNBy8OGIwByVDMzvJeDyugAxiOUCXltZrJ-UCRTKt3cLsXVRS4FuF7MEpVE1Fydb1wB_F39nNWdnWxdXNb8goJy5BbBxYxgC7CmxmoNO5wU1ncKcQLtSCpCrFDdBBrYAoGl5JUIMTCmpwgyczrCb14QZOHyhE97CDOzgFZrJxUBBaC4sFmEQCi5IBa3gLAI2E0vSU4sOLykRZVBycw1x9tAFWhMP91O8iyvcRSGGxmIMLMDOfqoEg0IKsMGfYppibpycZAlsqZhZpKaZA1t0KZYGRimJxmbmkgzSeAySwisrz8DpEeLrE-_j6ectzcAFOYDAWNfQQoaBpaSoNFUWWL2WJMmBwwUAkJ99GA |
openUrl | ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Apatent&rft.title=Speichertestger%C3%A4t&rft.inventor=GOISHI%2C+MASARU%2C+MEIWA%2C+GUNMA%2C+JP&rft.date=1999-03-18&rft.externalDBID=T1&rft.externalDocID=DE19781611TT1 |