Novel rapid plate thickness measuring micrometer

• Main Authors: ZHAO KAI, LUO SHUANMOU, LI JINHUI, WANG XINMIN, LUO QIANWEI, CAO JIMIN, KOU RUI
• Format: Patent
• Language: Chinese; English
• Published: 26.04.2024
• Subjects: MEASURING; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS; PHYSICS; TESTING

The utility model relates to a measuring tool, in particular to a novel rapid plate thickness measuring micrometer, which comprises a measuring mechanism and at least one group of extrusion mechanisms, and the measuring mechanism and the extrusion mechanisms are arranged on a support frame. The meas...