Novel rapid plate thickness measuring micrometer

• Main Authors: ZHAO KAI, LUO SHUANMOU, LI JINHUI, WANG XINMIN, LUO QIANWEI, CAO JIMIN, KOU RUI
• Format: Patent
• Language: Chinese; English
• Published: 26.04.2024
• Subjects: MEASURING; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS; PHYSICS; TESTING

The utility model relates to a measuring tool, in particular to a novel rapid plate thickness measuring micrometer, which comprises a measuring mechanism and at least one group of extrusion mechanisms, and the measuring mechanism and the extrusion mechanisms are arranged on a support frame. The measuring mechanism comprises a distance measuring structure, the distance measuring structure comprises a first handle, the first handle is connected with an extrusion mechanism, so that when the first handle is pressed, the distance measuring structure and the extrusion mechanism are driven to synchronously lift up, and when the first handle removes the pressing force, the distance measuring structure and the extrusion mechanism synchronously move down; the pressing plates are used for pressing different positions on the supporting frame; the extrusion mechanism has a fixing effect on a measured object and prevents the measured object from shaking, and the measuring device has the advantages that the operation is eas