Universal FPC key function test module and universal FPC key function test system
The utility model is suitable for the technical field of keys, and provides a general FPC key function test module and a general FPC key function test system. The general FPC key function test module comprises an FPC interface, an MCU and an upper connection interface. The FPC interface is used for...
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Format | Patent |
Language | Chinese English |
Published |
17.10.2023
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Online Access | Get full text |
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Abstract | The utility model is suitable for the technical field of keys, and provides a general FPC key function test module and a general FPC key function test system. The general FPC key function test module comprises an FPC interface, an MCU and an upper connection interface. The FPC interface is used for connecting the FPC key and providing a plurality of internal pins; the MCU is respectively connected with the FPC interface and the upper connection interface, and is used for scanning high and low level states of a plurality of pins of the FPC interface and generating test key values; the upper connection interface is used for being connected with an upper computer so as to transmit the test key value to the upper computer. The FPC key testing device is simple in structure and can be used for achieving automatic testing of FPC keys, and the testing efficiency is improved.
本申请适用于按键技术领域,提供了一种通用FPC按键功能测试模块和通用FPC按键功能测试系统。该通用FPC按键功能测试模块包括FPC接口、MCU和上位连接接口;FPC接口用于连接FPC按键并提供多个内部引脚;MCU分别与FPC接口和上位连接接口相连,用于扫描FPC接口的多个引脚的高低电平状 |
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AbstractList | The utility model is suitable for the technical field of keys, and provides a general FPC key function test module and a general FPC key function test system. The general FPC key function test module comprises an FPC interface, an MCU and an upper connection interface. The FPC interface is used for connecting the FPC key and providing a plurality of internal pins; the MCU is respectively connected with the FPC interface and the upper connection interface, and is used for scanning high and low level states of a plurality of pins of the FPC interface and generating test key values; the upper connection interface is used for being connected with an upper computer so as to transmit the test key value to the upper computer. The FPC key testing device is simple in structure and can be used for achieving automatic testing of FPC keys, and the testing efficiency is improved.
本申请适用于按键技术领域,提供了一种通用FPC按键功能测试模块和通用FPC按键功能测试系统。该通用FPC按键功能测试模块包括FPC接口、MCU和上位连接接口;FPC接口用于连接FPC按键并提供多个内部引脚;MCU分别与FPC接口和上位连接接口相连,用于扫描FPC接口的多个引脚的高低电平状 |
Author | LI TIENIU |
Author_xml | – fullname: LI TIENIU |
BookMark | eNrjYmDJy89L5WQIDM3LLEstKk7MUXALcFbITq1USCvNSy7JzM9TKEktLlHIzU8pzUlVSMxLUSgloLS4srgkNZeHgTUtMac4lRdKczMoubmGOHvophbkx6cWFyQmp-allsQ7-xkZWlqYGBmaGISGGhOlCAA6uznI |
ContentType | Patent |
DBID | EVB |
DatabaseName | esp@cenet |
DatabaseTitleList | |
Database_xml | – sequence: 1 dbid: EVB name: esp@cenet url: http://worldwide.espacenet.com/singleLineSearch?locale=en_EP sourceTypes: Open Access Repository |
DeliveryMethod | fulltext_linktorsrc |
Discipline | Medicine Chemistry Sciences Physics |
DocumentTitleAlternate | 通用FPC按键功能测试模块和通用FPC按键功能测试系统 |
ExternalDocumentID | CN219842140UU |
GroupedDBID | EVB |
ID | FETCH-epo_espacenet_CN219842140UU3 |
IEDL.DBID | EVB |
IngestDate | Fri Jul 19 12:55:28 EDT 2024 |
IsOpenAccess | true |
IsPeerReviewed | false |
IsScholarly | false |
Language | Chinese English |
LinkModel | DirectLink |
MergedId | FETCHMERGED-epo_espacenet_CN219842140UU3 |
Notes | Application Number: CN202322418433U |
OpenAccessLink | https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20231017&DB=EPODOC&CC=CN&NR=219842140U |
ParticipantIDs | epo_espacenet_CN219842140UU |
PublicationCentury | 2000 |
PublicationDate | 20231017 |
PublicationDateYYYYMMDD | 2023-10-17 |
PublicationDate_xml | – month: 10 year: 2023 text: 20231017 day: 17 |
PublicationDecade | 2020 |
PublicationYear | 2023 |
RelatedCompanies | GUANGDONG YUNCHI TIMES TECHNOLOGY CO., LTD |
RelatedCompanies_xml | – name: GUANGDONG YUNCHI TIMES TECHNOLOGY CO., LTD |
Score | 3.6315644 |
Snippet | The utility model is suitable for the technical field of keys, and provides a general FPC key function test module and a general FPC key function test system.... |
SourceID | epo |
SourceType | Open Access Repository |
SubjectTerms | MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR |
Title | Universal FPC key function test module and universal FPC key function test system |
URI | https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20231017&DB=EPODOC&locale=&CC=CN&NR=219842140U |
hasFullText | 1 |
inHoldings | 1 |
isFullTextHit | |
isPrint | |
link | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwhV3dS8MwED_m_HzTqqhTCSJ9K5o2tdvDEJauDGFdlVX2NpK2Q2V2w7UI_vVeYud8mq9JOC4XfveR3F0AroV01TlL1H630mJ0Qi3RzCYWU93RkoQK21XFyf3wrhezh5E7qsHbshZG9wn91M0REVEJ4r3Q-nq-usTydW7l4ka-4tDsPhi2fbOKjpWzQj3T77S70cAfcJPzNg_N8EkBs8lsjCbiDdhEN9pTaOg-d1RVyvyvSQn2YStCanlxALWvFwN2-fLnNQN2-tWDtwHbOkMzWeBghcLFITxW2RRiSoKIE4QhUeZJcU3QcyzI-ywtpxkReUrKf5b-dHI-gqugO-Q9C7kc_4pkzMPVhmLnGOr5LM9OgLSa1JGpnTiITWbbGDYnLUmFZMLLJHOcU2isIXS2drYBe0rCSnFT7xzqxUeZXaBFLuSlFuU3C3iQHQ |
link.rule.ids | 230,309,783,888,25576,76876 |
linkProvider | European Patent Office |
linkToHtml | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwhV3dT8IwEL8gfuCbTo2KH40xe1u0W3HjgZjQsaCygQYMb6TdRtTgRmTExL_e6xziE762zeV6ze8-2rsrwKWQNXXOErXftTQYHVNDOPHYYKo7WhhSYdZUcbIf3LQH7H5YG5bgbVELk_cJ_cybIyKiQsR7luvr6fISy81zK2dX8hWH0luv33D1IjpWzgq1dbfZaPW6bpfrnDd4oAdPCpgOMzGaGKzBOrrYtkJD67mpqlKmf02KtwMbPaSWZLtQ-nrRoMIXP69psOUXD94abOYZmuEMBwsUzvbgscimEBPi9ThBGBJlnhTXBD3HjLyn0XwSE5FEZP7P0p9Ozvtw4bX6vG0gl6NfkYx4sNzQwDqAcpIm8SGQukMtGZmhhdhkpolhc1iXVEgm7FgyyzqC6gpCxytnz6HS7vudUecueKjCtpK2UuLUPoFy9jGPT9E6Z_IsF-s3-l-TEA |
openUrl | ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Apatent&rft.title=Universal+FPC+key+function+test+module+and+universal+FPC+key+function+test+system&rft.inventor=LI+TIENIU&rft.date=2023-10-17&rft.externalDBID=U&rft.externalDocID=CN219842140UU |