IC (integrated circuit) electronic component test fixture with mother-son board structure

• Main Authors: GE ZHU, AI YUHAN, LONG LIJUN
• Format: Patent
• Language: Chinese; English
• Published: 05.05.2023
• Subjects: MEASURING; MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES; PHYSICS; TESTING

The utility model relates to an integrated circuit (IC) electronic component test fixture with a daughter board and mother board structure, which belongs to the technical field of electronic component test and comprises a test clamping board, two groups of connecting row seats are arranged on the surface of the test clamping board, one end of the test clamping board is provided with a connecting end connected with a test machine, the connecting row seats are connected with daughter boards, and the test clamping board is a sorting machine printed circuit board (PCB) test board. The daughter board is a testing machine application board, a fixing screw penetrates through the outer surface of the testing clamping board, and the testing clamping board is electrically connected with the testing machine through the fixing screw. The PCB mother board has the beneficial effects that a test clamping plate of a sorting machine is changed into a mother board in a 78PIN port form and then is directly connected with a test