Detection tool compatible with VCSEL and EEL test boards

The utility model relates to the technical field of test board detection, in particular to a detection jig compatible with VCSEL and EEL test boards, and solves the problems that in the prior art, for different chip modules, the shapes and other parameters of PCBs for testing are different, the PCBs...

Full description

Saved in:
Bibliographic Details
Main Authors SHEN KAI, DUAN CHUANMING, ZHAO NAN, YANG JIAN, TIAN ZHENG
Format Patent
LanguageChinese
English
Published 09.12.2022
Subjects
Online AccessGet full text

Cover

Loading…
Abstract The utility model relates to the technical field of test board detection, in particular to a detection jig compatible with VCSEL and EEL test boards, and solves the problems that in the prior art, for different chip modules, the shapes and other parameters of PCBs for testing are different, the PCBs cannot be recycled after the testing is completed, the PCBs are directly discarded after the testing is completed, the test jig is customized repeatedly, the cost is low, and the like. Product development progress is seriously delayed, and research and development cost of enterprises is increased. Therefore, how to simplify the testing process of the vertical cavity surface emitting laser VCSEL and the edge emitting laser EEL is the technical problem which needs to be solved by technicians in the field at present. A detection jig compatible with VCSEL and EEL test plates comprises a bottom plate, one side of the top of the bottom plate is fixedly connected with a stand column mounting plate, and a guide rail mount
AbstractList The utility model relates to the technical field of test board detection, in particular to a detection jig compatible with VCSEL and EEL test boards, and solves the problems that in the prior art, for different chip modules, the shapes and other parameters of PCBs for testing are different, the PCBs cannot be recycled after the testing is completed, the PCBs are directly discarded after the testing is completed, the test jig is customized repeatedly, the cost is low, and the like. Product development progress is seriously delayed, and research and development cost of enterprises is increased. Therefore, how to simplify the testing process of the vertical cavity surface emitting laser VCSEL and the edge emitting laser EEL is the technical problem which needs to be solved by technicians in the field at present. A detection jig compatible with VCSEL and EEL test plates comprises a bottom plate, one side of the top of the bottom plate is fixedly connected with a stand column mounting plate, and a guide rail mount
Author YANG JIAN
TIAN ZHENG
ZHAO NAN
SHEN KAI
DUAN CHUANMING
Author_xml – fullname: SHEN KAI
– fullname: DUAN CHUANMING
– fullname: ZHAO NAN
– fullname: YANG JIAN
– fullname: TIAN ZHENG
BookMark eNrjYmDJy89L5WSwcEktSU0uyczPUyjJz89RSM7PLUgsyUzKSVUozyzJUAhzDnb1UUjMS1FwBdIlqcUlCkn5iUUpxTwMrGmJOcWpvFCam0HJzTXE2UM3tSA_PrW4IDE5NS-1JN7Zz8jQwsDA2MTSIDTUmChFAPZJL6E
ContentType Patent
DBID EVB
DatabaseName esp@cenet
DatabaseTitleList
Database_xml – sequence: 1
  dbid: EVB
  name: esp@cenet
  url: http://worldwide.espacenet.com/singleLineSearch?locale=en_EP
  sourceTypes: Open Access Repository
DeliveryMethod fulltext_linktorsrc
Discipline Medicine
Chemistry
Sciences
Physics
DocumentTitleAlternate 一种兼容VCSEL和EEL测试板的检测治具
ExternalDocumentID CN218003490UU
GroupedDBID EVB
ID FETCH-epo_espacenet_CN218003490UU3
IEDL.DBID EVB
IngestDate Fri Jul 19 14:43:14 EDT 2024
IsOpenAccess true
IsPeerReviewed false
IsScholarly false
Language Chinese
English
LinkModel DirectLink
MergedId FETCHMERGED-epo_espacenet_CN218003490UU3
Notes Application Number: CN202221820132U
OpenAccessLink https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20221209&DB=EPODOC&CC=CN&NR=218003490U
ParticipantIDs epo_espacenet_CN218003490UU
PublicationCentury 2000
PublicationDate 20221209
PublicationDateYYYYMMDD 2022-12-09
PublicationDate_xml – month: 12
  year: 2022
  text: 20221209
  day: 09
PublicationDecade 2020
PublicationYear 2022
RelatedCompanies KETAI GUANGXIN (CHANGZHOU) TESTING TECHNOLOGY CO., LTD
RelatedCompanies_xml – name: KETAI GUANGXIN (CHANGZHOU) TESTING TECHNOLOGY CO., LTD
Score 3.5686197
Snippet The utility model relates to the technical field of test board detection, in particular to a detection jig compatible with VCSEL and EEL test boards, and...
SourceID epo
SourceType Open Access Repository
SubjectTerms MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
Title Detection tool compatible with VCSEL and EEL test boards
URI https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20221209&DB=EPODOC&locale=&CC=CN&NR=218003490U
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV3fS8MwED7m_PmmVVGnEkT6Vty6dmkfhrC0Y4jrhq5jbyNpM1SkHTYi-Nd7jZ3zaU-BC4RL4Etyl---ANw6iSfdhHuWkD63HN5uWX5KuUU7i9SmwnV-tfSGUWcQOw8zd1aDt1UtjNYJ_dLiiIioBPGu9H69XCexAs2tLO7EK5ry-_6kG5hVdGzbZSmoGfS64XgUjJjJWJdFZvSEwPS0FEsz3oJtvEbTEg3htFdWpSz_Hyn9Q9gZ42iZOoLa94sB-2z185oBe8PqwduAXc3QTAo0VigsjsFD3zSDKiMqz9-J5pEr9FOSMq1Kpuw5fCQ8S0mILd4lFRF5WVx1Ajf9cMIGFjoz_5v5nEVrv-P2KdSzPJNnQNym9DFQcrnk3GnJVHCRUttNF57kXovSc2hsGOhiY28DDsqF1JQN_xLq6uNTXuHBq8S1XrEfCryHAA
link.rule.ids 230,309,783,888,25576,76876
linkProvider European Patent Office
linkToHtml http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV3fT8IwEL4g_sA3RYmKPxpj9rbIxka3B2JCN4IKgygQ3ki7lagxG5EaE_96bxXEJ56aXJPm2uRre9fvvgLcOLEn3Zh7ppA-Nx1et0w_odykjVliU-E6v1p6vajRGTkPE3dSgLdVLYzWCf3S4oiIqBjxrvR-PV8nsQLNrVzcilc0ZXftYTMwltGxbeeloEbQaoaDftBnBmNNFhnREwLT01IstdEWbOMVm-ZoCMetvCpl_v9IaR_AzgBHS9UhFL5fylBiq5_XyrDXWz54l2FXMzTjBRqXKFwcgYe-aQZVSlSWvRPNI1fopyR5WpWM2XPYJTxNSIgt3iUVEVleXHUM1-1wyDomOjP9m_mURWu_R_UKFNMslSdA3Jr0MVByueTcsWQiuEio7SYzT3LPovQUqhsGOtvYewWlzrDXnXbvo8cq7OeLqukb_jkU1cenvMBDWIlLvXo_i06J8w
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Apatent&rft.title=Detection+tool+compatible+with+VCSEL+and+EEL+test+boards&rft.inventor=SHEN+KAI&rft.inventor=DUAN+CHUANMING&rft.inventor=ZHAO+NAN&rft.inventor=YANG+JIAN&rft.inventor=TIAN+ZHENG&rft.date=2022-12-09&rft.externalDBID=U&rft.externalDocID=CN218003490UU