Integrated circuit and method for controlling the temperature of a semiconductor material having an integrated circuit
A circuit is disclosed, integrated in a semiconductor material, for measuring signals of a sensor assigned to the integrated circuit. In at least one embodiment, the circuit includes an active component; a temperature sensor; and a circuit to control the temperature of the semiconductor material. Th...
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| Main Author | |
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| Format | Patent |
| Language | English |
| Published |
27.06.2007
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| Subjects | |
| Online Access | Get full text |
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| Abstract | A circuit is disclosed, integrated in a semiconductor material, for measuring signals of a sensor assigned to the integrated circuit. In at least one embodiment, the circuit includes an active component; a temperature sensor; and a circuit to control the temperature of the semiconductor material. The active component is provided to treat the measuring signals produced by the sensor and the active component is drivable by the circuit to control the temperature in such a way that the temperature of the semiconductor material is variable. A method for controlling the temperature of a semiconductor material that has an integrated circuit is further disclosed. |
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| AbstractList | A circuit is disclosed, integrated in a semiconductor material, for measuring signals of a sensor assigned to the integrated circuit. In at least one embodiment, the circuit includes an active component; a temperature sensor; and a circuit to control the temperature of the semiconductor material. The active component is provided to treat the measuring signals produced by the sensor and the active component is drivable by the circuit to control the temperature in such a way that the temperature of the semiconductor material is variable. A method for controlling the temperature of a semiconductor material that has an integrated circuit is further disclosed. |
| Author | HEISMANN BJORN,WINKELMANN HELMUT |
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| Notes | Application Number: CN200610166972 |
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| PublicationCentury | 2000 |
| PublicationDate | 20070627 |
| PublicationDateYYYYMMDD | 2007-06-27 |
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| PublicationDecade | 2000 |
| PublicationYear | 2007 |
| RelatedCompanies | SIEMENS AG |
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| Snippet | A circuit is disclosed, integrated in a semiconductor material, for measuring signals of a sensor assigned to the integrated circuit. In at least one... |
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| SubjectTerms | BASIC ELECTRIC ELEMENTS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY MEASUREMENT OF NUCLEAR OR X-RADIATION MEASURING PHYSICS SEMICONDUCTOR DEVICES TESTING |
| Title | Integrated circuit and method for controlling the temperature of a semiconductor material having an integrated circuit |
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