Specimen analyzing tool

The present invention provides a sample analysis tool that can be fed to an analysis part of an analyzer automatically without causing any inconvenience when set in the analyzer, even in the case where the number of test items to be tested by the sample analysis tool is small. In the sample analysis...

Full description

Saved in:
Bibliographic Details
Main Author SAKAMOTO HISASHI,MURATA YASUHITO
Format Patent
LanguageEnglish
Published 16.08.2006
Subjects
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
Online AccessGet full text

Cover

Abstract The present invention provides a sample analysis tool that can be fed to an analysis part of an analyzer automatically without causing any inconvenience when set in the analyzer, even in the case where the number of test items to be tested by the sample analysis tool is small. In the sample analysis tool including a substrate and at least one reagent pad provided on the substrate, a balance pad further is provided on the substrate so as to adjust at least one of weight balance and friction balance. The substrate is in a strip-shape. One end portion of the substrate serves as a holding portion and a portion other than the holding portion serves as a reagent pad arrangement region. The at least one reagent pad is provided on a side opposite to a holding portion side in the reagent pad arrangement region and the balance pad is provided on the holding portion side in the reagent pad arrangement region.
AbstractList The present invention provides a sample analysis tool that can be fed to an analysis part of an analyzer automatically without causing any inconvenience when set in the analyzer, even in the case where the number of test items to be tested by the sample analysis tool is small. In the sample analysis tool including a substrate and at least one reagent pad provided on the substrate, a balance pad further is provided on the substrate so as to adjust at least one of weight balance and friction balance. The substrate is in a strip-shape. One end portion of the substrate serves as a holding portion and a portion other than the holding portion serves as a reagent pad arrangement region. The at least one reagent pad is provided on a side opposite to a holding portion side in the reagent pad arrangement region and the balance pad is provided on the holding portion side in the reagent pad arrangement region.
Author SAKAMOTO HISASHI,MURATA YASUHITO
Author_xml – fullname: SAKAMOTO HISASHI,MURATA YASUHITO
BookMark eNrjYmDJy89L5WQQDy5ITc7MTc1TSMxLzKmsysxLVyjJz8_hYWBNS8wpTuWF0twM8m6uIc4euqkF-fGpxQWJyal5qSXxzn6GFkYGhpaWjsaEVQAAGEoi8w
ContentType Patent
DBID EVB
DatabaseName esp@cenet
DatabaseTitleList
Database_xml – sequence: 1
  dbid: EVB
  name: esp@cenet
  url: http://worldwide.espacenet.com/singleLineSearch?locale=en_EP
  sourceTypes: Open Access Repository
DeliveryMethod fulltext_linktorsrc
Discipline Medicine
Chemistry
Sciences
Physics
ExternalDocumentID CN1820199A
GroupedDBID EVB
ID FETCH-epo_espacenet_CN1820199A3
IEDL.DBID EVB
IngestDate Fri Oct 04 04:57:03 EDT 2024
IsOpenAccess true
IsPeerReviewed false
IsScholarly false
Language English
LinkModel DirectLink
MergedId FETCHMERGED-epo_espacenet_CN1820199A3
Notes Application Number: CN200580000578
OpenAccessLink https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20060816&DB=EPODOC&CC=CN&NR=1820199A
ParticipantIDs epo_espacenet_CN1820199A
PublicationCentury 2000
PublicationDate 20060816
PublicationDateYYYYMMDD 2006-08-16
PublicationDate_xml – month: 08
  year: 2006
  text: 20060816
  day: 16
PublicationDecade 2000
PublicationYear 2006
RelatedCompanies ARKRAY INC
RelatedCompanies_xml – name: ARKRAY INC
Score 2.6490684
Snippet The present invention provides a sample analysis tool that can be fed to an analysis part of an analyzer automatically without causing any inconvenience when...
SourceID epo
SourceType Open Access Repository
SubjectTerms INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
Title Specimen analyzing tool
URI https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20060816&DB=EPODOC&locale=&CC=CN&NR=1820199A
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwY2BQMTExTjQ2STTXNUlKAxIppha6SammxrrmJqkGqRagA-zAgzm-fmYeoSZeEaYRTAwZsL0w4HNCy8GHIwJzVDIwv5eAy-sCxCCWC3htZbF-UiZQKN_eLcTWRQ3eOwbdI6Hm4mTrGuDv4u-s5uxs6-yn5hdkCzqn3NDS0pGZgRXYiDYHLf5yDXMC7UkpQK5Q3AQZ2AKAZuWVCDEwpeYJM3A6w-5dE2bg8IVOdwszsIPXZyYXAwWhebBYhEEcfGV8bmqeQiLoQJEqYN2jUJKfnyPKIO_mGuLsoQu0Kx7urXhnP5ijjMUYWICd_VQJBgVTIwNzoyRgLjE1TjIxSU0E9kbSUoAd2FTjNHMDC_MUSQYJXKZI4ZaSZuCCDB0Ae4xmMgwsJUWlqbLAyrQkSQ4cDgD2tHc2
link.rule.ids 230,309,783,888,25578,76884
linkProvider European Patent Office
linkToHtml http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwY2BQMTExTjQ2STTXNUlKAxIppha6SammxrrmJqkGqRagA-zAgzm-fmYeoSZeEaYRTAwZsL0w4HNCy8GHIwJzVDIwv5eAy-sCxCCWC3htZbF-UiZQKN_eLcTWRQ3eOwbdI6Hm4mTrGuDv4u-s5uxs6-yn5hdkCzqn3NDS0pGZgRXYwLYAnbLvGuYE2pNSgFyhuAkysAUAzcorEWJgSs0TZuB0ht27JszA4Qud7hZmYAevz0wuBgpC82CxCIM4-Mr43NQ8hUTQgSJVwLpHoSQ_P0eUQd7NNcTZQxdoVzzcW_HOfjBHGYsxsAA7-6kSDAqmRgbmRknAXGJqnGRikpoI7I2kpQA7sKnGaeYGFuYpkgwSuEyRwi0lz8DpEeLrE-_j6ectzcAFGUYA9h7NZBhYSopKU2WBFWtJkhw4TAC0yHom
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Apatent&rft.title=Specimen+analyzing+tool&rft.inventor=SAKAMOTO+HISASHI%2CMURATA+YASUHITO&rft.date=2006-08-16&rft.externalDBID=A&rft.externalDocID=CN1820199A