Grain grain falling track image acquisition test device

The invention relates to a grain grain falling track image acquisition test device which comprises a device support and a rotating support, a grain falling pipe is arranged on the rotating support, a grain loading hole is formed in the side wall of the grain falling pipe, and a left grain support an...

Full description

Saved in:
Bibliographic Details
Main Authors LIU SHIMIN, ZHAO CHAO, ZHANG HAOBO, ZHANG ZHONGYUAN, MA HONGLIN, LIU JIAQI, LUO TAOYING, BAI CHUNQI, YAN LEI, HOU XIAOLONG, XU JIWEN
Format Patent
LanguageChinese
English
Published 16.08.2024
Subjects
Online AccessGet full text

Cover

Loading…
Abstract The invention relates to a grain grain falling track image acquisition test device which comprises a device support and a rotating support, a grain falling pipe is arranged on the rotating support, a grain loading hole is formed in the side wall of the grain falling pipe, and a left grain support and a right grain support are hinged to the positions, on the lower side of the grain loading hole, of the grain falling pipe. The adjacent ends of the left grain support and the right grain support are supporting ends, the opposite ends of the left grain support and the right grain support are control ends, the left grain support and the right grain support are provided with a bearing station and a grain falling station in the rotating process, and a high-speed camera used for shooting the free falling process of the grains is arranged beside the device support. The invention provides the grain falling track testing device for the grain grains, which is used for observing the movement track and posture change of the
AbstractList The invention relates to a grain grain falling track image acquisition test device which comprises a device support and a rotating support, a grain falling pipe is arranged on the rotating support, a grain loading hole is formed in the side wall of the grain falling pipe, and a left grain support and a right grain support are hinged to the positions, on the lower side of the grain loading hole, of the grain falling pipe. The adjacent ends of the left grain support and the right grain support are supporting ends, the opposite ends of the left grain support and the right grain support are control ends, the left grain support and the right grain support are provided with a bearing station and a grain falling station in the rotating process, and a high-speed camera used for shooting the free falling process of the grains is arranged beside the device support. The invention provides the grain falling track testing device for the grain grains, which is used for observing the movement track and posture change of the
Author LIU SHIMIN
BAI CHUNQI
LUO TAOYING
YAN LEI
XU JIWEN
ZHANG HAOBO
LIU JIAQI
MA HONGLIN
ZHAO CHAO
HOU XIAOLONG
ZHANG ZHONGYUAN
Author_xml – fullname: LIU SHIMIN
– fullname: ZHAO CHAO
– fullname: ZHANG HAOBO
– fullname: ZHANG ZHONGYUAN
– fullname: MA HONGLIN
– fullname: LIU JIAQI
– fullname: LUO TAOYING
– fullname: BAI CHUNQI
– fullname: YAN LEI
– fullname: HOU XIAOLONG
– fullname: XU JIWEN
BookMark eNrjYmDJy89L5WQwdy9KzMxTSAeTaYk5OZl56QolRYnJ2QqZuYnpqQqJyYWlmcWZJZn5eQolqcUlCimpZZnJqTwMrEDVxam8UJqbQdHNNcTZQze1ID8-tbggMTk1L7Uk3tnP0NDC1MDQ0MTM0ZgYNQDCTy-C
ContentType Patent
DBID EVB
DatabaseName esp@cenet
DatabaseTitleList
Database_xml – sequence: 1
  dbid: EVB
  name: esp@cenet
  url: http://worldwide.espacenet.com/singleLineSearch?locale=en_EP
  sourceTypes: Open Access Repository
DeliveryMethod fulltext_linktorsrc
Discipline Medicine
Chemistry
Sciences
Physics
DocumentTitleAlternate 一种粮食籽粒落粮轨迹图像采集试验装置
ExternalDocumentID CN118501146A
GroupedDBID EVB
ID FETCH-epo_espacenet_CN118501146A3
IEDL.DBID EVB
IngestDate Fri Nov 01 05:40:20 EDT 2024
IsOpenAccess true
IsPeerReviewed false
IsScholarly false
Language Chinese
English
LinkModel DirectLink
MergedId FETCHMERGED-epo_espacenet_CN118501146A3
Notes Application Number: CN202410618203
OpenAccessLink https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20240816&DB=EPODOC&CC=CN&NR=118501146A
ParticipantIDs epo_espacenet_CN118501146A
PublicationCentury 2000
PublicationDate 20240816
PublicationDateYYYYMMDD 2024-08-16
PublicationDate_xml – month: 08
  year: 2024
  text: 20240816
  day: 16
PublicationDecade 2020
PublicationYear 2024
RelatedCompanies HENAN UNIVERSITY OF TECHNOLOGY
RelatedCompanies_xml – name: HENAN UNIVERSITY OF TECHNOLOGY
Score 3.6939042
Snippet The invention relates to a grain grain falling track image acquisition test device which comprises a device support and a rotating support, a grain falling...
SourceID epo
SourceType Open Access Repository
SubjectTerms INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
Title Grain grain falling track image acquisition test device
URI https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20240816&DB=EPODOC&locale=&CC=CN&NR=118501146A
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV3dS8MwED_m_HzTquj8IIL0rUi_0vahiEtbh7BuyJS9jSZttYrdXDsE_3qT2Dlf9CUPFzgugftK7n4HcGnkVpJmua0ZZsY0K8G5RhPL0HRGXeql2HTk_JR-jHsP1t3YHrfgZdkLI3FCPyQ4ItcoxvW9lvZ6tnrECmRtZXVFC06aXkcjP1Cb7FjgdelYDbp-OBwEA6IS4pNYje99HkfbIvbHN2uwzsNoR2hD-NgVXSmz3y4l2oWNIedW1nvQ-nxWYJssJ68psNVvPrwV2JQVmqzixEYLq31wbsVcB_Qk1zyRqNqonifsFRVv3D6ghL0viu9iLMRDyRqlmTAIB3ARhSPS07gsk5-DT0i8Ets8hHY5LbMjQJ4lgMAoNlLTtVw79WjKc0uKXcawnWH7GDp_8-n8t3kCO-ISxZupjk-hXc8X2Rl3ujU9l7f1BW_thZo
link.rule.ids 230,309,783,888,25576,76876
linkProvider European Patent Office
linkToHtml http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV3dS8MwED_m_JhvOhWdXxGkb0X6lbYPRVy6WXXrhkzZW2nSVqe4zbVD8K83iZ3zRV_ycIHjEriv5O53AOd6ZsZJmlmqbqRMNWOcqTQ2dVVj1KFugg1bzk_phjh4MG-H1rACL4teGIkT-iHBEblGMa7vhbTX0-Ujli9rK_MLOuKkyWV74PlKmR0LvC4NK37Ta_V7fo8ohHgkVMJ7j8fRloj98dUKrPIQ2xba0Hpsiq6U6W-X0t6CtT7nNi62ofL5XIcaWUxeq8NGt_zwrsO6rNBkOSeWWpjvgH0t5jqgJ7lmsUTVRsUsZq9o9MbtA4rZ-3z0XYyFeChZoCQVBmEXztqtAQlULkv0c_CIhEuxjT2ojifjdB-QawogMIr1xHBMx0pcmvDckmKHMWyl2DqAxt98Gv9tnkItGHQ7UecmvDuETXGh4v1Uw0dQLWbz9Jg74IKeyJv7At9XiI0
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Apatent&rft.title=Grain+grain+falling+track+image+acquisition+test+device&rft.inventor=LIU+SHIMIN&rft.inventor=ZHAO+CHAO&rft.inventor=ZHANG+HAOBO&rft.inventor=ZHANG+ZHONGYUAN&rft.inventor=MA+HONGLIN&rft.inventor=LIU+JIAQI&rft.inventor=LUO+TAOYING&rft.inventor=BAI+CHUNQI&rft.inventor=YAN+LEI&rft.inventor=HOU+XIAOLONG&rft.inventor=XU+JIWEN&rft.date=2024-08-16&rft.externalDBID=A&rft.externalDocID=CN118501146A