Multi-type microwave signal source general metrological verification system construction method and computer equipment

• Main Authors: CHEN MINYA, LI YUHUI, ZHANG CHUNLIANG, ZHANG HAIRUI, SUN YUNDE, FENG YADONG, MOU YIZHE, ZHANG QIANPING, SHI CHENHANG
• Format: Patent
• Language: Chinese; English
• Published: 25.06.2024
• Subjects: MEASURING; MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES; PHYSICS; TESTING

The invention discloses a multi-type microwave signal source general metrological verification system construction method, which comprises the following steps of S1, analyzing a general metrological demand covering all detected objects by adopting a qualitative analysis method according to a signal...