Calibrating device for surface contamination instrument

• Main Authors: HAN YIWEN, YAO YANLING, MENG LINGZE, ZHU BAOJI, YAO SHUNHE, XU LIJUN, LIU YUNTAO
• Format: Patent
• Language: Chinese; English
• Published: 03.05.2024
• Subjects: MEASUREMENT OF NUCLEAR OR X-RADIATION; MEASURING; PHYSICS; TESTING

The invention relates to the technical field of surface pollution monitoring, and provides a calibration device for a surface pollution meter, the calibration device comprises a lifting box, a support frame and a standard source, the lifting box comprises a box cover and a box body, an accommodating cavity is formed in the box body, and a pick-and-place opening communicated with the accommodating cavity is formed in the top end surface of the box body; the box cover can selectively shield or open the pick-and-place opening; the supporting frame is arranged in the containing cavity. The standard source is arranged on the support frame, the standard source is one of an alpha source and a beta source, and the active surface of the standard source faces the pick-and-place opening. The standard source and the supporting frame are both arranged in the containing cavity, in the state that the box cover shields the taking and placing opening, external objects cannot make contact with the standard source, the external