Smart card aging test method and device and storage medium

The invention discloses a smart card aging test method and device and a storage medium, and the method comprises the steps: obtaining an application selection instruction sent by a terminal, and selecting an application according to the application selection instruction; obtaining an updating self-c...

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Bibliographic Details
Main Authors YUAN WAIPING, LUO JIA, YANG HUANGLIN, CHENG RAN, FU WENJUN, CHEN YUYING, HUANG WEIWEN
Format Patent
LanguageChinese
English
Published 26.04.2024
Subjects
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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