Smart card aging test method and device and storage medium

• Main Authors: YUAN WAIPING, LUO JIA, YANG HUANGLIN, CHENG RAN, FU WENJUN, CHEN YUYING, HUANG WEIWEN
• Format: Patent
• Language: Chinese; English
• Published: 26.04.2024
• Subjects: MEASURING; MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES; PHYSICS; TESTING

The invention discloses a smart card aging test method and device and a storage medium, and the method comprises the steps: obtaining an application selection instruction sent by a terminal, and selecting an application according to the application selection instruction; obtaining an updating self-checking instruction sent by the terminal; a write-in transaction of the application is performed according to the update self-check instruction, the write-in transaction characterizes that the first data and the second data are written into a target area respectively, and a return value is generated; and sending the return value to the terminal, so that the terminal continues the aging test or ends the aging test according to the return value. According to the technical scheme of the embodiment, the aging test is carried out on the intelligent card by selecting the application, data interaction between the terminal and the intelligent card is reduced, the test speed is high, and the test period is short. 本发明公开了一种智能