Accuracy management method and manufacturing method for evaluation part

• Main Authors: SHIWAKU JUN, INOUE, YUTARO, KOBAYASHI KOTA
• Format: Patent
• Language: Chinese; English
• Published: 09.04.2024
• Subjects: CALCULATING; COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS; COMPUTING; COUNTING; ELECTRIC DIGITAL DATA PROCESSING; PHYSICS

The problem to be solved by the present invention is to provide a method for managing the accuracy of an evaluation part and a method for manufacturing the evaluation part, in which a regression equation related to the accuracy of a component is obtained with a small amount of data. In order to solv...