Application of testing heating uniformity of heater of ingot furnace and method for improving silicon quality

• Main Authors: ZHANG HUALI, ZHAO YUBING, HU DONGLI, WANG CHEN, ZHOU JIE, CHEN HONGRONG
• Format: Patent
• Language: Chinese; English
• Published: 29.03.2024
• Subjects: AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUSPOLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR; CASTING; CASTING OF METALS; CASTING OF OTHER SUBSTANCES BY THE SAME PROCESSES OR DEVICES; CHEMISTRY; CRYSTAL GROWTH; METALLURGY; PERFORMING OPERATIONS; POWDER METALLURGY; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITHDEFINED STRUCTURE; REFINING BY ZONE-MELTING OF MATERIAL; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITHDEFINED STRUCTURE; SINGLE-CRYSTAL-GROWTH; TRANSPORTING; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL ORUNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL

The invention discloses application of testing heating uniformity of an ingot furnace heater and a method for improving silicon quality. Specifically, the invention discloses application of testing the heating uniformity of an ingot furnace heater in the fields of preparing a silicon ingot, and/or i...