Application of testing heating uniformity of heater of ingot furnace and method for improving silicon quality

• Main Authors: ZHANG HUALI, ZHAO YUBING, HU DONGLI, WANG CHEN, ZHOU JIE, CHEN HONGRONG
• Format: Patent
• Language: Chinese; English
• Published: 29.03.2024
• Subjects: AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUSPOLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR; CASTING; CASTING OF METALS; CASTING OF OTHER SUBSTANCES BY THE SAME PROCESSES OR DEVICES; CHEMISTRY; CRYSTAL GROWTH; METALLURGY; PERFORMING OPERATIONS; POWDER METALLURGY; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITHDEFINED STRUCTURE; REFINING BY ZONE-MELTING OF MATERIAL; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITHDEFINED STRUCTURE; SINGLE-CRYSTAL-GROWTH; TRANSPORTING; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL ORUNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL

The invention discloses application of testing heating uniformity of an ingot furnace heater and a method for improving silicon quality. Specifically, the invention discloses application of testing the heating uniformity of an ingot furnace heater in the fields of preparing a silicon ingot, and/or improving the quality of the silicon ingot, and/or roughly judging the quality of the prepared silicon ingot, and/or roughly judging the defect position and dislocation proportion of the prepared silicon ingot. Therefore, the silicon ingot preparation process can be smoothly and safely carried out, the quality of the prepared silicon ingot is improved, and the distribution area and density of defects such as dislocation possibly generated by the silicon ingot are reduced; meanwhile, a new thought and a simple method for rapid screening are provided for judging whether the quality of the silicon ingot reaches the standard or not. 本发明公开了测试铸锭炉加热器发热均匀性的用途和提高硅品质的方法。其中，具体公开了测试铸锭炉加热器发热均匀性在制备硅锭、和/或改善硅锭品质、和/或粗判已制得的硅锭品质、和/或粗判