Integrated and multi-parameter special test equipment based on PXIe bus

• Main Authors: LIAO YUEMIN, LIAO HAIQIAN, ZHAO ZHONGZE, LUO RONGXIN
• Format: Patent
• Language: Chinese; English
• Published: 26.03.2024
• Subjects: MEASURING; MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES; PHYSICS; TESTING

The invention discloses an integrated and multi-parameter special test device based on a PXIe bus. Comprising a radio-frequency microwave signal module, a low-frequency signal module, a direct-current voltage module, a voltage, resistance and frequency measurement module, a low-frequency signal analysis module, a multi-channel current acquisition module, a radio-frequency signal analysis module, an embedded master control module, a PXIe bus case, a damping cabinet, a large-current detection module and an adaptive tool. According to the invention, the test parameters of a plurality of devices are integrated on one integrated test device, manual test steps are simplified, and test, record and report generation are integrated in our devices, so that the labor cost is greatly reduced, and the uncertainty of manual operation is reduced. 本发明公开了一种基于PXIe总线的一体化、多参数专用测试设备，包括射频微波信号模块、低频信号模块、直流电压模块、电压、电阻及频率测量模块、低频信号分析模块、多通道电流采集模块、射频信号分析模块、嵌入式主控模块、PXIe总线机箱、减震机柜、大电流检测模块和适配工装；本发明将多台设备的测试参数集中到一台一体化测试设备上，将人工测试步骤简化，将测试、记录、报告生成