Device for testing communication signal of single-chip microcomputer
The invention relates to the technical field of single-chip microcomputer testing, in particular to a device for testing communication signals of a single-chip microcomputer. The device comprises a base and a material guiding device installed at the top end of the base. The current to-be-detected si...
Saved in:
Main Authors | , , |
---|---|
Format | Patent |
Language | Chinese English |
Published |
23.02.2024
|
Subjects | |
Online Access | Get full text |
Cover
Loading…
Abstract | The invention relates to the technical field of single-chip microcomputer testing, in particular to a device for testing communication signals of a single-chip microcomputer. The device comprises a base and a material guiding device installed at the top end of the base. The current to-be-detected single-chip microcomputer is limited through the detection cavity, each to-be-detected single-chip microcomputer entering the detection cavity is kept in the same state, at the moment, the detection assembly slides along the side face of the detection cavity, the detection work of the to-be-detected single-chip microcomputer is completed through contact between the detection assembly and the to-be-detected single-chip microcomputer, and therefore automatic detection work is achieved. The detection efficiency is improved, the detection process of each single-chip microcomputer to be detected can be kept consistent, the influence of irrelevant factors on the detection result is reduced, and the accuracy of the detectio |
---|---|
AbstractList | The invention relates to the technical field of single-chip microcomputer testing, in particular to a device for testing communication signals of a single-chip microcomputer. The device comprises a base and a material guiding device installed at the top end of the base. The current to-be-detected single-chip microcomputer is limited through the detection cavity, each to-be-detected single-chip microcomputer entering the detection cavity is kept in the same state, at the moment, the detection assembly slides along the side face of the detection cavity, the detection work of the to-be-detected single-chip microcomputer is completed through contact between the detection assembly and the to-be-detected single-chip microcomputer, and therefore automatic detection work is achieved. The detection efficiency is improved, the detection process of each single-chip microcomputer to be detected can be kept consistent, the influence of irrelevant factors on the detection result is reduced, and the accuracy of the detectio |
Author | CHEN YUN WU FANGFANG SUN YAFANG |
Author_xml | – fullname: WU FANGFANG – fullname: CHEN YUN – fullname: SUN YAFANG |
BookMark | eNqNyj0OwjAMQOEMMPB3B3OASlSoKoyoBTExsVeR5aaWEjtKUs5PBw7A9N7wbc1KVGhj-p4-jASjJiiUC4sD1BBmYbSFVSCzE-tBx-XEeapw4giBMekC41wo7c16tD7T4dedOT7u7-5ZUdSBcrRIQmXoXnXdNtdTe2lu53_MFwBENRk |
ContentType | Patent |
DBID | EVB |
DatabaseName | esp@cenet |
DatabaseTitleList | |
Database_xml | – sequence: 1 dbid: EVB name: esp@cenet url: http://worldwide.espacenet.com/singleLineSearch?locale=en_EP sourceTypes: Open Access Repository |
DeliveryMethod | fulltext_linktorsrc |
Discipline | Medicine Chemistry Sciences Physics |
DocumentTitleAlternate | 一种测试单片机通信信号的装置 |
ExternalDocumentID | CN117590785A |
GroupedDBID | EVB |
ID | FETCH-epo_espacenet_CN117590785A3 |
IEDL.DBID | EVB |
IngestDate | Fri Jul 19 13:14:39 EDT 2024 |
IsOpenAccess | true |
IsPeerReviewed | false |
IsScholarly | false |
Language | Chinese English |
LinkModel | DirectLink |
MergedId | FETCHMERGED-epo_espacenet_CN117590785A3 |
Notes | Application Number: CN202311641462 |
OpenAccessLink | https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20240223&DB=EPODOC&CC=CN&NR=117590785A |
ParticipantIDs | epo_espacenet_CN117590785A |
PublicationCentury | 2000 |
PublicationDate | 20240223 |
PublicationDateYYYYMMDD | 2024-02-23 |
PublicationDate_xml | – month: 02 year: 2024 text: 20240223 day: 23 |
PublicationDecade | 2020 |
PublicationYear | 2024 |
RelatedCompanies | JIANGSU JINXIN INTEGRATED CIRCUIT TECHNOLOGY CO., LTD |
RelatedCompanies_xml | – name: JIANGSU JINXIN INTEGRATED CIRCUIT TECHNOLOGY CO., LTD |
Score | 3.6614287 |
Snippet | The invention relates to the technical field of single-chip microcomputer testing, in particular to a device for testing communication signals of a single-chip... |
SourceID | epo |
SourceType | Open Access Repository |
SubjectTerms | CONTROL OR REGULATING SYSTEMS IN GENERAL CONTROLLING FUNCTIONAL ELEMENTS OF SUCH SYSTEMS MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS PHYSICS REGULATING |
Title | Device for testing communication signal of single-chip microcomputer |
URI | https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20240223&DB=EPODOC&locale=&CC=CN&NR=117590785A |
hasFullText | 1 |
inHoldings | 1 |
isFullTextHit | |
isPrint | |
link | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV1LS8NAEB5qfd40KlofrCC5BTWb9HEIYjcJRWhapEpvJbvd2EpNgokI_np3ltT2otdZWHYH5j3zDcC1rbTerVTar2O3uQpQYmrFCaWW4LzVSeSdoAIDxX7U7D07j2N3XIO35SyMxgn90uCISqKEkvdS6-t8lcTydW9lccPnipTdhyPPN6voGEsFNjX9rhcMB_6AmYx5LDKjJw8RKVUc2HYfNmAT3WjE2Q9eujiVkq-blHAftobqtrQ8gNr3zIBdtty8ZsBOvyp4G7CtOzRFoYiVFBaH4PsS5Zsof5OUiJKRvhKxPuhBsCsjXpAsIZgKWEhLzOY5ecfmO1GtcTiCqzAYsZ6lHjb55cKERas_0GOop1kqT4DIOJF2y40pdZtOgqienFNOHTmdOm4s5Sk0_r6n8d_hGewhR_X8Nj2HevnxKS-UBS75pWbdDxVDi6s |
link.rule.ids | 230,309,786,891,25594,76906 |
linkProvider | European Patent Office |
linkToHtml | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV1LS8NAEB5qfdSbVkXrawXJLajZpI9DELtpqNqmRar0VrLbja3UpJiI4K93Z0ltL3qdhWV3YN4z3wBcWkrrXUul_RpWnasAJaRmGFFqCs5rjUjeCCowUOwG1faz_TB0hgV4W8zCaJzQLw2OqCRKKHnPtL6eL5NYnu6tTK_4VJGSW3_gekYeHWOpwKKG13Rb_Z7XYwZjLguM4MlFREoVB9aduzVYryE6L7pOL02cSpmvmhR_Bzb66rY424XC96QMJbbYvFaGrW5e8C7Dpu7QFKki5lKY7oHnSZRvovxNkiFKRvxKxOqgB8GujHBGkohgKmAmTTGZzsk7Nt-JfI3DPlz4rQFrm-pho18ujFiw_AM9gGKcxPIQiAwjadWckFKnakeI6sk55dSW47HthFIeQeXveyr_HZ5DqT3odkad--DxGLaRu3qWm55AMfv4lKfKGmf8TLPxB8Zzjpg |
openUrl | ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Apatent&rft.title=Device+for+testing+communication+signal+of+single-chip+microcomputer&rft.inventor=WU+FANGFANG&rft.inventor=CHEN+YUN&rft.inventor=SUN+YAFANG&rft.date=2024-02-23&rft.externalDBID=A&rft.externalDocID=CN117590785A |