Signature quality inspection method and device

• Main Authors: WU BAOTING, LI HONG, LIU SHAOWU, KONG YI, LIU FUSHENG, YU YITING, WU WEI, ZHANG HONGHONG, CHEN ZHUO, LIN GANG, ZHU JIAN, FANG SHAOYIN, CUI ZHISHUN, NI CHUNYA, CHEN HANXIANG, XU YAOSHUN, PANG BIN, DANG ZHIJUN, WAN QI, ZUO JIAN, ZHANG HAOJIE, LI ZIMENG, YU XIANGCHEN, JI YI, KANG YUE, CAI JINGYI, CAI TIEGUANG, WANG SONG, SUN JIANJUN, ZHENG HAOBIN
• Format: Patent
• Language: Chinese; English
• Published: 14.11.2023
• Subjects: CALCULATING; COMPUTING; COUNTING; PHYSICS

The invention relates to the technical field of artificial intelligence, in particular to a signature quality inspection method and device. The signature quality inspection method comprises the following steps: correcting a first image by adopting an affine transformation matrix to obtain a second i...