Nondestructive testing pen based on low-frequency magnetic flux leakage

• Main Authors: ZHU BIN, ZHANG RUIMENG, SHEN CHANGYU, ZHU ZHOUHONG, ZHOU JUN, YUAN FEIYI, YANG JIAO, LI SHENGRU, WANG ZHAOKUN, LI XIANG
• Format: Patent
• Language: Chinese; English
• Published: 29.08.2023
• Subjects: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASURING; PHYSICS; TESTING

The invention discloses a nondestructive testing pen based on low-frequency magnetic flux leakage. The nondestructive testing pen is characterized by comprising a switch, a battery, a signal generation module, a signal amplifier, a magnet yoke, a coil, a Hall element array, a magnetic concentrator, a magnetic shielding layer, a signal conditioning module, a wireless communication module, a computer, a shell and a sliding rail, the signal generation module is composed of a single-chip microcomputer, an FPGA, a level switching circuit, an MAX295 chip, a low-pass filter and an amplitude adjusting circuit. The signal conditioning module is composed of a high-pass filter, a clock generator, an anti-aliasing filter, an analog multiplexer and an A/D converter. A signal generated by the battery passes through the signal generation module and is amplified by the signal amplifier, an electromagnetic field is generated in space, a leakage magnetic field is formed at a defect place, and leakage magnetism is captured by t