Cross validation method for electromagnetic side channel information of vehicle-gauge-level security chip

• Main Authors: ZHAO RUI, LI MINGYANG, XIA XIANZHAO, RONG HUI, ZHAI RUIQING, LI YUJIA, DOU RUPENG, ZHANG LIXIONG
• Format: Patent
• Language: Chinese; English
• Published: 07.07.2023
• Subjects: ELECTRIC COMMUNICATION TECHNIQUE; ELECTRICITY; MEASURING; MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES; PHYSICS; TESTING; TRANSMISSION

The invention relates to a cross validation method for electromagnetic side channel information of a vehicle gauge level security chip, and relates to the technical field of chip testing. Q test plaintexts are input into M to-be-tested chips of the same batch and the same model; batch-level and area-level testing is realized by performing XOR operation on curve characteristic values of the same test plaintext and the same gridding area of different chips to be tested and performing batch cross validation on the chips to be tested; meanwhile, in consideration of different electromagnetic signal noises in different areas, denoising strategies for different areas are adopted, fine denoising is realized, and the test efficiency is also improved by batch denoising. 本发明涉及一种车规级安全芯片的电磁侧信道信息的交叉验证方法，涉及芯片测试技术领域，通过将q条测试明文均输入至M颗同批次同型号的待测芯片中，通过对不同待测芯片同一条测试明文同一个网格化区域的曲线特征值进行异或操作，对各待测芯片进行批量交叉验证，实现了批量级、区域级的测试；同时在考虑到不同区域电磁信号噪声不同的情况，采用针对不同区域的去噪策略，实现了精细化去噪，批量化去噪也提高了测试效率。