Semiconductor device

A semiconductor device includes: a data sampler configured to receive a data signal having a first frequency and sample the data signal with a clock signal having a second frequency higher than the first frequency, and output data of a time corresponding to a unit interval of the data signal; an err...

Full description

Saved in:
Bibliographic Details
Main Authors CHOI DONG CHEOL, LEE SU-EUN, KIM JI-YOUNG, PARK JAE-HYUN, SUN SHIYU, LEE HYUN-JOO
Format Patent
LanguageChinese
English
Published 30.05.2023
Subjects
Online AccessGet full text

Cover

Loading…
Abstract A semiconductor device includes: a data sampler configured to receive a data signal having a first frequency and sample the data signal with a clock signal having a second frequency higher than the first frequency, and output data of a time corresponding to a unit interval of the data signal; an error sampler configured to sample the data signal with an error clock signal having a second frequency and having a phase different from that of the clock signal, and output a plurality of pieces of error data at a time corresponding to the unit interval; and an eye opening monitoring (EOM) circuit configured to compare the data with each of the plurality of pieces of error data to obtain an eye pattern of the data signal in the unit interval. 一种半导体装置包括:数据采样器,其被配置为接收具有第一频率的数据信号并且以具有高于第一频率的第二频率的时钟信号对数据信号进行采样,输出与数据信号的单位间隔对应的时间的数据;错误采样器,其被配置为以具有第二频率并且相位与时钟信号的相位不同的错误时钟信号对数据信号进行采样,输出与单位间隔对应的时间的多条错误数据;以及眼开度监测(EOM)电路,其被配置为比较数据与多条错误数据中的每一条以获得单位间隔中的数据信号的眼图。
AbstractList A semiconductor device includes: a data sampler configured to receive a data signal having a first frequency and sample the data signal with a clock signal having a second frequency higher than the first frequency, and output data of a time corresponding to a unit interval of the data signal; an error sampler configured to sample the data signal with an error clock signal having a second frequency and having a phase different from that of the clock signal, and output a plurality of pieces of error data at a time corresponding to the unit interval; and an eye opening monitoring (EOM) circuit configured to compare the data with each of the plurality of pieces of error data to obtain an eye pattern of the data signal in the unit interval. 一种半导体装置包括:数据采样器,其被配置为接收具有第一频率的数据信号并且以具有高于第一频率的第二频率的时钟信号对数据信号进行采样,输出与数据信号的单位间隔对应的时间的数据;错误采样器,其被配置为以具有第二频率并且相位与时钟信号的相位不同的错误时钟信号对数据信号进行采样,输出与单位间隔对应的时间的多条错误数据;以及眼开度监测(EOM)电路,其被配置为比较数据与多条错误数据中的每一条以获得单位间隔中的数据信号的眼图。
Author KIM JI-YOUNG
SUN SHIYU
PARK JAE-HYUN
LEE SU-EUN
CHOI DONG CHEOL
LEE HYUN-JOO
Author_xml – fullname: CHOI DONG CHEOL
– fullname: LEE SU-EUN
– fullname: KIM JI-YOUNG
– fullname: PARK JAE-HYUN
– fullname: SUN SHIYU
– fullname: LEE HYUN-JOO
BookMark eNrjYmDJy89L5WQQCU7NzUzOz0spTS7JL1JISS3LTE7lYWBNS8wpTuWF0twMim6uIc4euqkF-fGpxQWJyal5qSXxzn6GhmaGlkam5iaOxsSoAQAkmSKw
ContentType Patent
DBID EVB
DatabaseName esp@cenet
DatabaseTitleList
Database_xml – sequence: 1
  dbid: EVB
  name: esp@cenet
  url: http://worldwide.espacenet.com/singleLineSearch?locale=en_EP
  sourceTypes: Open Access Repository
DeliveryMethod fulltext_linktorsrc
Discipline Medicine
Chemistry
Sciences
DocumentTitleAlternate 半导体装置
ExternalDocumentID CN116192574A
GroupedDBID EVB
ID FETCH-epo_espacenet_CN116192574A3
IEDL.DBID EVB
IngestDate Fri Jul 19 13:10:40 EDT 2024
IsOpenAccess true
IsPeerReviewed false
IsScholarly false
Language Chinese
English
LinkModel DirectLink
MergedId FETCHMERGED-epo_espacenet_CN116192574A3
Notes Application Number: CN202211491314
OpenAccessLink https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20230530&DB=EPODOC&CC=CN&NR=116192574A
ParticipantIDs epo_espacenet_CN116192574A
PublicationCentury 2000
PublicationDate 20230530
PublicationDateYYYYMMDD 2023-05-30
PublicationDate_xml – month: 05
  year: 2023
  text: 20230530
  day: 30
PublicationDecade 2020
PublicationYear 2023
RelatedCompanies SAMSUNG ELECTRONICS CO., LTD
RelatedCompanies_xml – name: SAMSUNG ELECTRONICS CO., LTD
Score 3.6041028
Snippet A semiconductor device includes: a data sampler configured to receive a data signal having a first frequency and sample the data signal with a clock signal...
SourceID epo
SourceType Open Access Repository
SubjectTerms ELECTRIC COMMUNICATION TECHNIQUE
ELECTRICITY
TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHICCOMMUNICATION
Title Semiconductor device
URI https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20230530&DB=EPODOC&locale=&CC=CN&NR=116192574A
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwY2BQSTZKMk9MTjLSTTaySNMFNeB1LUxMUnWT0ixTjFJSktMSU0EdRV8_M49QE68I0wgmhizYXhjwOaHl4MMRgTkqGZjfS8DldQFiEMsFvLayWD8pEyiUb-8WYuuiBu0dA9vTpsYGai5Otq4B_i7-zmrOzrbOfmp-QbaGhqCegqm5iSMzAyuoGQ06Z981zAm0K6UAuUpxE2RgCwCallcixMBUlSHMwOkMu3lNmIHDFzrhDWRC816xCINIMGgde34e6IDW_CKFlFRQHhdlUHRzDXH20AUaHw_3S7yzH8IlxmIMLMA-fqoEg0JiUqK5WUqyoSUwP5mkJSZaJiabmxummRiZJAMbYJbJkgxSuM2RwicpzcAFChfwhLeBDANLSVFpqiywHi1JkgMHAACnKHbV
link.rule.ids 230,309,786,891,25594,76903
linkProvider European Patent Office
linkToHtml http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwY2BQSTZKMk9MTjLSTTaySNMFNeB1LUxMUnWT0ixTjFJSktMSU0EdRV8_M49QE68I0wgmhizYXhjwOaHl4MMRgTkqGZjfS8DldQFiEMsFvLayWD8pEyiUb-8WYuuiBu0dA9vTpsYGai5Otq4B_i7-zmrOzrbOfmp-QbaGhqCegqm5iSMzA6s5sEsI7iqFOYF2pRQgVyluggxsAUDT8kqEGJiqMoQZOJ1hN68JM3D4Qie8gUxo3isWYRAJBq1jz88DHdCaX6SQkgrK46IMim6uIc4eukDj4-F-iXf2Q7jEWIyBBdjHT5VgUEhMSjQ3S0k2tATmJ5O0xETLxGRzc8M0EyOTZGADzDJZkkEKtzlS-CTlGTg9Qnx94n08_bylGbhAYQSe_DaQYWApKSpNlQXWqSVJcuDAAABaZnm_
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Apatent&rft.title=Semiconductor+device&rft.inventor=CHOI+DONG+CHEOL&rft.inventor=LEE+SU-EUN&rft.inventor=KIM+JI-YOUNG&rft.inventor=PARK+JAE-HYUN&rft.inventor=SUN+SHIYU&rft.inventor=LEE+HYUN-JOO&rft.date=2023-05-30&rft.externalDBID=A&rft.externalDocID=CN116192574A