Defect detection model interpretation method and device, equipment and storage medium

• Main Authors: WANG WEI, ZHU ZHILING, GUO XINGCHENG, FAN QIQIANG
• Format: Patent
• Language: Chinese; English
• Published: 30.05.2023
• Subjects: CALCULATING; COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS; COMPUTING; COUNTING; ELECTRIC DIGITAL DATA PROCESSING; PHYSICS

The invention discloses a defect detection model interpretation method and device, equipment and a storage medium. The method comprises the steps that a deep convolutional neural network is established, and a defect detection model and the probability that each metric element has defects are obtaine...