Article inspection device and article inspection method

• Main Authors: TAKADA OSAMU, WAKI SHINYA
• Format: Patent
• Language: Chinese; English
• Published: 18.04.2023
• Subjects: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASURING; PHYSICS; TESTING

An article inspection device for inspecting a workpiece (W) including a plurality of materials (Wa, Wb, Wc, Wd) using an inspection image thereof, the article inspection device being provided with: an X-ray image memory (61) for storing information on a predetermined detection value related to the inspection image; a camera (41) that captures an image of the workpiece (W) as a vision sensor; a configuration determination unit (53) that performs a predetermined recognition process on the basis of image data of the workpiece (W) captured by the camera (41), and determines the material configuration of the contents of the workpiece (W); and a proposal output unit (54) that, when the material structure of the content is determined by the structure determination unit (53), estimates the detection sensitivity with respect to a predetermined detection value on the basis of the stored information in the X-ray image memory (61) and the management sensitivity memory (64), and proposals and outputs a determination refer