Instrument performance verification system

• Main Authors: LI GUAN, CHEN YUHAN, GE DANG, MAO SHENSHEN, ZHOU MING, LI YAPING, WANG YAOXIAN, TIAN HONGBO, ZHANG JUAN, CAO DANFU, DING SUNING, LI SUJIE, XIE ZILI
• Format: Patent
• Language: Chinese; English
• Published: 11.04.2023
• Subjects: ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS; MEASURING; MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR; PHYSICS; TARIFF METERING APPARATUS; TESTING

The invention relates to an instrument performance verification system, which comprises an upper computer 1, a PLC (Programmable Logic Controller) measurement and control cabinet 2, a safety barrier 6, a direct-current power supply 7, a protocol conversion module 8, a signal concentrator 9, a commun...