MEMORY SYSTEM DETERMINING TARGET STATE READ CHECK
The present disclosure provides a memory system and a method of operating the same. The memory system may determine a target state read check period based on a threshold voltage distribution offset of a target memory die when it is determined that the memory system enters a thermal throttling mode,...
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Format | Patent |
Language | Chinese English |
Published |
07.03.2023
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Subjects | |
Online Access | Get full text |
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Abstract | The present disclosure provides a memory system and a method of operating the same. The memory system may determine a target state read check period based on a threshold voltage distribution offset of a target memory die when it is determined that the memory system enters a thermal throttling mode, and set a timer to transmit a state read command of the target memory die to the memory device based on the target state read check period.
本公开提供了一种存储器系统和操作该存储器系统的方法。存储器系统可以在确定存储器系统进入热节流模式时基于目标存储器管芯的阈值电压分布偏移来确定目标状态读取检查时段,并且设置定时器以基于目标状态读取检查时段将目标存储器管芯的状态读取命令传输到存储器装置。 |
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AbstractList | The present disclosure provides a memory system and a method of operating the same. The memory system may determine a target state read check period based on a threshold voltage distribution offset of a target memory die when it is determined that the memory system enters a thermal throttling mode, and set a timer to transmit a state read command of the target memory die to the memory device based on the target state read check period.
本公开提供了一种存储器系统和操作该存储器系统的方法。存储器系统可以在确定存储器系统进入热节流模式时基于目标存储器管芯的阈值电压分布偏移来确定目标状态读取检查时段,并且设置定时器以基于目标状态读取检查时段将目标存储器管芯的状态读取命令传输到存储器装置。 |
Author | LEE SEON-JU JI YOU MIN LEE DAE-SEUL |
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DocumentTitleAlternate | 确定目标状态读取检查时段的存储器系统及其操作方法 |
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Snippet | The present disclosure provides a memory system and a method of operating the same. The memory system may determine a target state read check period based on a... |
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Title | MEMORY SYSTEM DETERMINING TARGET STATE READ CHECK |
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