Method and system for verifying measurement algorithm through synthetic parameters
The invention discloses a method for verifying a measurement algorithm through synthetic parameters, which relates to the technical field of image processing and comprises the following steps: generating a verification image containing a plurality of target physical quantities through algorithm deve...
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Main Authors | , |
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Format | Patent |
Language | Chinese English |
Published |
15.07.2022
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Subjects | |
Online Access | Get full text |
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Summary: | The invention discloses a method for verifying a measurement algorithm through synthetic parameters, which relates to the technical field of image processing and comprises the following steps: generating a verification image containing a plurality of target physical quantities through algorithm development software; digital signal data obtained after conversion of the verification image is obtained, and patient information and scanning view parameters are added into the digital signal data; converting the digital signal data into a composite image under the imaging medical standard according to the actual measurement of the target physical quantity and the scanning view parameters; extracting the measurement of each target physical quantity in the synthetic image through a target measurement algorithm; and obtaining the algorithm accuracy of the target measurement algorithm according to the measurement metric and the actual metric of the corresponding target physical quantity. According to the method, the pro |
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Bibliography: | Application Number: CN202210229113 |