SYSTEM AND METHOD FOR MONITORING PRESS LINE DEFECTS
The present disclosure provides a system and method for monitoring defects in a press line. A method of inspecting a stamped blank on a stamping line includes identifying at least one target defect location for a given stamped blank configuration, wherein a unique defect type is associated with each...
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Main Authors | , , , , |
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Format | Patent |
Language | Chinese English |
Published |
13.05.2022
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Subjects | |
Online Access | Get full text |
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