Method and device for finely depicting thin interbed overlay pinned reservoir and electronic equipment

• Main Authors: ZHANG JIANNING, HU WEI, LI LUXI, LI NA, PEI SIJIA
• Format: Patent
• Language: Chinese; English
• Published: 13.05.2022
• Subjects: DETECTING MASSES OR OBJECTS; GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; MEASURING; PHYSICS; TESTING

The invention provides a method and device for finely depicting a thin interbed overlying pinned reservoir and electronic equipment. According to the invention, based on forward modeling, pinching geologic models of different angles are established, and the relationship between different pinching angles and seismic data identification errors is analyzed; and then the real position of the pinching line is corrected and reversely deduced through the relation. According to the method, the advantages of a waveform indication simulation inversion method are fully utilized, specific quality information represented by different well data parameters is analyzed, and finally the distribution and thickness prediction of the thin interbed reservoir is realized. And finally, fully combining a forward and reverse result and a structural interpretation result, and jointly and finely depicting the thin interbed overlying pinned reservoir in the longitudinal direction and the planar reservoir range. The method achieves a goo