Gas chamber

• Main Authors: HERTEL MARTIN, TAZRIT, MEHMET, BERGSTROM PETER W, KONZRA RAKESH, VENTURINI FRANCESCO
• Format: Patent
• Language: Chinese; English
• Published: 10.05.2022
• Subjects: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASURING; PHYSICS; TESTING

The invention relates to a gas chamber (1) for the spectral, in particular absorptive analysis of a gas, in which the gas is exposed to an incident beam (S) of electromagnetic radiation and an exit beam (SA) of the electromagnetic radiation exiting the gas in order to form a measurement signal, the gas chamber (1) has a body (10) made of a porous material that scatters electromagnetic radiation, a coupling-in device (20) for coupling an incident beam (S) into the gas chamber (1), and a coupling-out device (30) for coupling an exit beam (SA) out of the gas chamber (1), a material-free chamber (12) being expanded in the body (10) according to the invention, the cavity is surrounded by an inner surface (14) which extends inside the material and which diffusely reflects and transmits the electromagnetic radiation. 本发明涉及一种用于对气体进行光谱式的、尤其是吸收光谱式的分析的气体室(1)，在该气体室中，所述气体暴露于电磁辐射的入射射束(S)中，并且该电磁辐射的从该气体出来的出射射束(SA)以形成测量信号，其中，该气体室(1)具有由对电磁辐射进行散射的多孔材料所构成的主体(10)、用于将入射射束(S)耦入到气体室(1)中的耦入装置(20)，和用于将出射射束(SA)从气体室(1)耦出的耦出装置(30)，其中，根据本