基于最小均方算法和随机梯度法，应用于具有已校准查找表的模数转换器的残差校准方法

• Format: Patent
• Language: Chinese
• Published: 05.04.2022
• Subjects: BASIC ELECTRONIC CIRCUITRY; CODE CONVERSION IN GENERAL; CODING; DECODING; ELECTRICITY

第一校准器检测电容阵列的不匹配情况，并用经过校准的权重更新查找表(LUT)，这些经过校准的权重复制到正LUT和负LUT，然后针对非线性误差通过第二校准器使用最小均方(LMS)算法进行调整。对逐次逼近寄存器(SAR)中的二进制代码进行补码，以生成具有符号位的补码。当符号位为正时，从正LUT中读取补码数据位＝1的条目并将其求和，添加第一偏移量，并将和归一化，以得到经过校正的代码。当符号位为负时，从负LUT中读取补码数据位＝0的条目并将其求和，添加第二偏移量，并将和归一化，以得到经过校正的代码。多变量随机梯度下降法生成进一步校正所述经过校正的代码的多项式系数。 A first calibration measures capacitor array mis-match and updates a Look-Up Table (LUT) with calibrated weights that are copied to both a positive LUT and a negative LUT, and then adjusted for non-linearity errors by a second calibration using a Least Mean-Square (LMS) method. The binary code in the Successive-Approximation Register (SAR) is complemented to generate a complement code with a sign bit. When the sign bit is positive, entries for complement code bits=1 are read from the positive LUT and summed, a first offset added, and the sum normalized to get a corrected code. When the sign bit is negative, entries for complement code bits=0 are read from the negative LUT and summed, a second offset added, and the sum normalized to g