Novel brightness temperature imaging method for exponential rough surface

The invention discloses a novel brightness temperature imaging method for an exponential rough surface. A traditional rough surface radiation model is relatively simple, when the rough surface is considered, only the rough surface is treated as a Gaussian rough surface, and a scene where an exponent...

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Bibliographic Details
Main Authors ZHANG PENGQUAN, ZHANG ZHONGHAI, WEI DUJUAN, XU PENGPENG, YIN CHUAN, GENG YOULIN
Format Patent
LanguageChinese
English
Published 17.12.2021
Subjects
CALCULATING
COMPUTING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
PHYSICS
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Summary:The invention discloses a novel brightness temperature imaging method for an exponential rough surface. A traditional rough surface radiation model is relatively simple, when the rough surface is considered, only the rough surface is treated as a Gaussian rough surface, and a scene where an exponential rough surface exists is ignored, that is, the Gaussian rough surface model is used for replacing the exponential rough surface model; the defect is that the brightness temperature of a scene with an exponential rough surface cannot be accurately simulated, so that the application range of passive millimeter wave radiation simulation is greatly limited. The method comprises the following steps: 1, proposing a radiation characteristic model of an exponential rough surface; 2, studying the difference between a Gaussian rough surface and an exponential rough surface; and 3, calculating the brightness temperature of the exponential rough surfaces with different roughness; and 4, comparing the brightness temperature
Bibliography:Application Number: CN202110936583