TEST ARRANGEMENT, AUTOMATED TEST EQUIPMENT AND METHOD FOR TESTING A DEVICE UNDER TEST COMPRISING A CIRCUIT AND AN ANTENNA WHICH IS COUPLED TO THE CIRCUIT

• Main Authors: HESSELBARTH JAN, MOREIRA JOSE
• Format: Patent
• Language: Chinese; English
• Published: 16.11.2021
• Subjects: MEASURING; MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES; PHYSICS; TESTING

An embodiment according to the present invention is a test arrangement for testing a DUT comprising an active circuit, and an antenna which is coupled to the circuit. The test arrangement comprises a DUT-location and a probe. Furthermore, the test arrangement comprises a ground area, which is configured to serve as an antenna ground area for an antenna of the DUT. The probe may be positioned, in a proximity of the ground area. The ground area comprises a tiny opening, such that the antenna feed impedance is not affected or not affected significantly. The DUT location is at a first side of the ground area while the probe is arranged at a second side of the ground area. The probe is adapted to weakly couple to the antenna of the DUT via the opening, in order to probe a signal when the antenna of the DUT is fed by the circuit of the DUT and/or in order to couple a signal to the antenna which is fed to the circuit of the DUT by the antenna. 根据本发明的一个实施例是一种用于测试包括有源电路和耦合到该电路的天线的DUT的测试布置。所述测试布置包括DUT位置和探针。此外，所述测试布置包括接