CONTROL DEVICE FOR CONTROLLING A MANUFACTURING PLANT, MANUFACTURING PLANT AND METHOD
The invention relates to a control device for controlling a manufacturing plant (1), the manufacturing plant (1) comprising at least one process station (2a, b, c) for carrying out a manufacturing process, the manufacturing plant (1) and/or the process station (2a, b, c) having at least one process...
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Main Authors | , , |
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Format | Patent |
Language | Chinese English |
Published |
23.07.2021
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Online Access | Get full text |
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Abstract | The invention relates to a control device for controlling a manufacturing plant (1), the manufacturing plant (1) comprising at least one process station (2a, b, c) for carrying out a manufacturing process, the manufacturing plant (1) and/or the process station (2a, b, c) having at least one process parameter (6) for open-loop and/or closed-loop control, the manufacturing plant (1) and/or the process station (2a, b, c) having at least one detection device for detecting at least one process feature (12). The control device has a first control module (7) and a second control module (11), the first control module (7) and the second control module (11) being designed to define a controlled value and/or a model for the process parameter (6) on the basis of a machine learning algorithm and the process feature (12) for closed-loop control of the manufacturing plant (1) and/or the process station (2a, b, c).
用于控制制造设施(1)的控制装置,其中所述制造设施(1)包括用于执行制造过程的至少一个过程站(2a、b、c),其中所述制造设施(1)和/或所述过程站(2a、b、c)具有用于调节和/或控制的至少一个过程参数(6),其中所述制 |
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AbstractList | The invention relates to a control device for controlling a manufacturing plant (1), the manufacturing plant (1) comprising at least one process station (2a, b, c) for carrying out a manufacturing process, the manufacturing plant (1) and/or the process station (2a, b, c) having at least one process parameter (6) for open-loop and/or closed-loop control, the manufacturing plant (1) and/or the process station (2a, b, c) having at least one detection device for detecting at least one process feature (12). The control device has a first control module (7) and a second control module (11), the first control module (7) and the second control module (11) being designed to define a controlled value and/or a model for the process parameter (6) on the basis of a machine learning algorithm and the process feature (12) for closed-loop control of the manufacturing plant (1) and/or the process station (2a, b, c).
用于控制制造设施(1)的控制装置,其中所述制造设施(1)包括用于执行制造过程的至少一个过程站(2a、b、c),其中所述制造设施(1)和/或所述过程站(2a、b、c)具有用于调节和/或控制的至少一个过程参数(6),其中所述制 |
Author | HLAVAC MARCUS SCHOEPF MARTIN M. WALTER |
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DocumentTitleAlternate | 用于控制制造设施的控制装置以及制造设施和方法 |
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Snippet | The invention relates to a control device for controlling a manufacturing plant (1), the manufacturing plant (1) comprising at least one process station (2a,... |
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SubjectTerms | CONTROL OR REGULATING SYSTEMS IN GENERAL CONTROLLING FUNCTIONAL ELEMENTS OF SUCH SYSTEMS MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS PHYSICS REGULATING |
Title | CONTROL DEVICE FOR CONTROLLING A MANUFACTURING PLANT, MANUFACTURING PLANT AND METHOD |
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