Project development process quality defect prediction method and device and medium

The invention discloses a project development process quality defect prediction method, which is applied to a quality management platform and comprises the following steps: acquiring first quality data of a plurality of projects completed by the quality management platform; establishing a prediction...

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Bibliographic Details
Main Author FAN XIAOGANG
Format Patent
LanguageChinese
English
Published 02.07.2021
Subjects
CALCULATING
COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS
COMPUTING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
HANDLING RECORD CARRIERS
PHYSICS
PRESENTATION OF DATA
RECOGNITION OF DATA
RECORD CARRIERS
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