Project development process quality defect prediction method and device and medium

• Main Author: FAN XIAOGANG
• Format: Patent
• Language: Chinese; English
• Published: 02.07.2021
• Subjects: CALCULATING; COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS; COMPUTING; COUNTING; ELECTRIC DIGITAL DATA PROCESSING; HANDLING RECORD CARRIERS; PHYSICS; PRESENTATION OF DATA; RECOGNITION OF DATA; RECORD CARRIERS

The invention discloses a project development process quality defect prediction method, which is applied to a quality management platform and comprises the following steps: acquiring first quality data of a plurality of projects completed by the quality management platform; establishing a prediction model according to the first quality data; importing second quality data of a project running on a quality management platform into the prediction model; and checking whether the defect probability of the project corresponding to the second quality data is greater than the health probability, if so, executing an alarm operation, and stopping the project running on the quality management platform. The quality data of the project running on the current quality management platform is obtained and adjusted, the adjustment process is accompanied by the whole project running process, the health or defect probability of the project is predicted through the prediction model, and when the defect probability is larger than