Product surface defect detection method and device and storage medium

• Main Authors: MENG FANWU, ZHOU SHIYUAN, HAO JUAN, PAN QINXUE, XU YICHEN
• Format: Patent
• Language: Chinese; English
• Published: 11.06.2021
• Subjects: CALCULATING; COMPUTING; COUNTING; IMAGE DATA PROCESSING OR GENERATION, IN GENERAL; PHYSICS

The invention provides a product surface defect detection method and device and a storage medium, and relates to the technical field of image processing, and the method comprises the steps: obtaining a product surface image of a to-be-detected product with a plurality of texture elements on the surface, carrying out the binarization processing of the product surface image, thereby obtaining a binary image corresponding to the product surface image, wherein the binary image comprises multiple connected regions; segmenting the product surface image into a plurality of texture images according to the plurality of connected regions, extracting Gaussian Markov features of each texture image, and according to the Gaussian Markov features of each texture image and preset Gaussian Markov features, performing surface defect detection on the to-be-detected product. The Gaussian Markov features can well describe the texture features, so that when the scheme is adopted to detect the surface defects of the product, the de