Semiconductor structure and manufacturing method thereof
A semiconductor structure includes a first passivation layer disposed over a metal line, a copper-containing RDL disposed over the first passivation layer, where the copper-containing RDL is electrically coupled to the metal line and where a portion of the copper-containing RDL in contact with a top...
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Main Authors | , |
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Format | Patent |
Language | Chinese English |
Published |
30.03.2021
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Subjects | |
Online Access | Get full text |
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Summary: | A semiconductor structure includes a first passivation layer disposed over a metal line, a copper-containing RDL disposed over the first passivation layer, where the copper-containing RDL is electrically coupled to the metal line and where a portion of the copper-containing RDL in contact with a top surface of the first passivation layer forms an acute angle, and a second passivation layer disposed over the copper-containing RDL, where an interface between the second passivation layer and a top surface of the copper-containing RDL is curved. The semiconductor structure may further include a polymeric layer disposed over the second passivation layer, where a portion of the polymeric layer extends to contact the copper-containing RDL, a bump electrically coupled to the copper-containing RDL,and a solder layer disposed over the bump. The embodiment of the invention also relates to a method for manufacturing the semiconductor structure.
半导体结构包括设置在金属线上方的第一钝化层,设置在第一钝化层上方的含铜RDL,其中含铜RDL电耦接至金属线,并且含铜RDL的与第一钝化层的上表面接触的部分 |
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Bibliography: | Application Number: CN202011026228 |