Secondary system fault positioning method based on improved Bayesian algorithm

The invention discloses a secondary system fault positioning method based on an improved Bayesian algorithm. An intelligent algorithm combining a virtual-real loop mapping method based on topologicalassociation and an improved Bayesian theory is adopted for solving. When a fault occurs, complete fau...

Full description

Saved in:
Bibliographic Details
Main Authors YANG CHAO, WANG XIN, LIU WENXUE, LI CONGCONG, SHI FANGFANG, TANG YI, ZHAO BINCHAO, LI NA, ZHANG QIANG, WANG YONG, GENG YUJIE, LIANG ZHENGTANG, SUN KONGMING, LIU MENG, GUAN TI, BAI YINGWEI, LI YUDUN, TONG XINYUAN, SUN JINGWEN, ZHANG GUOHUI, LI KUAN, WANG YONGBO
Format Patent
LanguageChinese
English
Published 26.02.2021
Subjects
Online AccessGet full text

Cover

Loading…
Abstract The invention discloses a secondary system fault positioning method based on an improved Bayesian algorithm. An intelligent algorithm combining a virtual-real loop mapping method based on topologicalassociation and an improved Bayesian theory is adopted for solving. When a fault occurs, complete fault information is difficult to obtain, an alarm may be lost, false, out-of-order, repeated, incomplete and the like, and a fault positioning result is affected. Therefore, a fault information completeness concept is provided, and in combination with the fault posterior probability, the fault-alarmdeterminacy of a suspicious fault element obtained through a topology-associated virtual-real loop mapping method is calculated, when the most possible previous fault completely covers an observed alarm set, it is considered that the optimal fault element set is found. According to the method, the fault positioning precision is improved. 一种基于改进贝叶斯算法的二次系统故障定位方法,采用基于拓扑关联的虚实回路映射法与改进的贝叶斯理论相结合的智能算法进行求解。发生故障时,完备的故障信息难以获取,告警可能丢失、
AbstractList The invention discloses a secondary system fault positioning method based on an improved Bayesian algorithm. An intelligent algorithm combining a virtual-real loop mapping method based on topologicalassociation and an improved Bayesian theory is adopted for solving. When a fault occurs, complete fault information is difficult to obtain, an alarm may be lost, false, out-of-order, repeated, incomplete and the like, and a fault positioning result is affected. Therefore, a fault information completeness concept is provided, and in combination with the fault posterior probability, the fault-alarmdeterminacy of a suspicious fault element obtained through a topology-associated virtual-real loop mapping method is calculated, when the most possible previous fault completely covers an observed alarm set, it is considered that the optimal fault element set is found. According to the method, the fault positioning precision is improved. 一种基于改进贝叶斯算法的二次系统故障定位方法,采用基于拓扑关联的虚实回路映射法与改进的贝叶斯理论相结合的智能算法进行求解。发生故障时,完备的故障信息难以获取,告警可能丢失、
Author SHI FANGFANG
WANG YONG
GUAN TI
LI NA
SUN KONGMING
SUN JINGWEN
TANG YI
WANG YONGBO
LIU MENG
LI KUAN
LI CONGCONG
LIANG ZHENGTANG
WANG XIN
GENG YUJIE
ZHAO BINCHAO
BAI YINGWEI
TONG XINYUAN
LIU WENXUE
ZHANG GUOHUI
YANG CHAO
LI YUDUN
ZHANG QIANG
Author_xml – fullname: YANG CHAO
– fullname: WANG XIN
– fullname: LIU WENXUE
– fullname: LI CONGCONG
– fullname: SHI FANGFANG
– fullname: TANG YI
– fullname: ZHAO BINCHAO
– fullname: LI NA
– fullname: ZHANG QIANG
– fullname: WANG YONG
– fullname: GENG YUJIE
– fullname: LIANG ZHENGTANG
– fullname: SUN KONGMING
– fullname: LIU MENG
– fullname: GUAN TI
– fullname: BAI YINGWEI
– fullname: LI YUDUN
– fullname: TONG XINYUAN
– fullname: SUN JINGWEN
– fullname: ZHANG GUOHUI
– fullname: LI KUAN
– fullname: WANG YONGBO
BookMark eNqNyj0OwjAMQOEMMPB3B3MAhqa9QKlATF1gr0zjtpESO6oDUm8PAwdget_wtmbFwrQx7Z16YYfzArpopggDvkKGJOqzF_Y8QqQ8iYMnKjkQBh_TLO-vz7iQemTAMMrs8xT3Zj1gUDr8ujPH6-XR3E6UpCNN2BNT7pq2KGxlbWmruvzn-QCTzzjP
ContentType Patent
DBID EVB
DatabaseName esp@cenet
DatabaseTitleList
Database_xml – sequence: 1
  dbid: EVB
  name: esp@cenet
  url: http://worldwide.espacenet.com/singleLineSearch?locale=en_EP
  sourceTypes: Open Access Repository
DeliveryMethod fulltext_linktorsrc
Discipline Medicine
Chemistry
Sciences
Physics
DocumentTitleAlternate 一种基于改进贝叶斯算法的二次系统故障定位方法
ExternalDocumentID CN112422324A
GroupedDBID EVB
ID FETCH-epo_espacenet_CN112422324A3
IEDL.DBID EVB
IngestDate Fri Jul 19 14:51:25 EDT 2024
IsOpenAccess true
IsPeerReviewed false
IsScholarly false
Language Chinese
English
LinkModel DirectLink
MergedId FETCHMERGED-epo_espacenet_CN112422324A3
Notes Application Number: CN202011176091
OpenAccessLink https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20210226&DB=EPODOC&CC=CN&NR=112422324A
ParticipantIDs epo_espacenet_CN112422324A
PublicationCentury 2000
PublicationDate 20210226
PublicationDateYYYYMMDD 2021-02-26
PublicationDate_xml – month: 02
  year: 2021
  text: 20210226
  day: 26
PublicationDecade 2020
PublicationYear 2021
RelatedCompanies ELECTRIC POWER RESEARCH INSTITUTE OF STATE GRID SHANDONG ELECTRIC POWER COMPANY
STATE GRID CORPORATION OF CHINA
STATE GRID SHANDONG ELECTRIC POWER COMPANY
RelatedCompanies_xml – name: ELECTRIC POWER RESEARCH INSTITUTE OF STATE GRID SHANDONG ELECTRIC POWER COMPANY
– name: STATE GRID CORPORATION OF CHINA
– name: STATE GRID SHANDONG ELECTRIC POWER COMPANY
Score 3.4470665
Snippet The invention discloses a secondary system fault positioning method based on an improved Bayesian algorithm. An intelligent algorithm combining a virtual-real...
SourceID epo
SourceType Open Access Repository
SubjectTerms CALCULATING
COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS
COMPUTING
COUNTING
ELECTRIC COMMUNICATION TECHNIQUE
ELECTRICITY
PHYSICS
TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHICCOMMUNICATION
Title Secondary system fault positioning method based on improved Bayesian algorithm
URI https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20210226&DB=EPODOC&locale=&CC=CN&NR=112422324A
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV3dT8IwEL8gfr7p1Ch-pCZmb4sK3QYPi5FuCzFhEEXDG9m6TjC4kTFi8K_3WkB80bemTS7tNdf7XXu_K8C1Gdo2omSZF4bbQKmgRqNOhWGKelLjCbdjxXJtB1brhT72zX4J3ldcGFUn9FMVR0SL4mjvhTqvJ-tLLFflVk5vohF2Zfd-z3H1ZXSs4hdLd5uO1-24HaYz5rBAD54chBW0KtHDwwZsShgt6-x7r03JSpn8din-Pmx1UVpaHEDpa6jBLlv9vKbBTnv54K3BtsrQ5FPsXFrh9BCCZxnFxmE-J4tCzCQJZ-OCrBKw0BuRxc_QRDqpmGQpGanLA2w3w7mQxEkSjt-yfFQMP47gyvd6rGXgFAc_-hiwYL2a2jGU0ywVJ0CoaIgEEUGCEITacRRxi_K78DaJ47rJLX4Klb_lVP4bPIM9qVvF5LbOoVzkM3GBvriILpUSvwGYkY7m
link.rule.ids 230,309,786,891,25594,76904
linkProvider European Patent Office
linkToHtml http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV3dT8IwEL8gfuCbokbxqyZmb0SRboOHxUg3MhUGUTS8ka3rBIMbgRGDf73XAuKLvjVtcmmvud7v2vtdAS513zQRJcu8MNwGSgUtVitUFHVRico84maoWK5Nz3Bf6ENX72bgfcmFUXVCP1VxRLQojvaeqvN6tLrEslVu5eQqGGBXclvvWLa2iI5V_GJods1y2i27xTTGLOZp3pOFsILeSPRwtwbrJoaEss6-81qTrJTRb5dS34GNNkqL013IfPXzkGPLn9fysNVcPHjnYVNlaPIJdi6scLIH3rOMYkN_PCPzQswk8qfDlCwTsNAbkfnP0EQ6qZAkMRmoywNs1_yZkMRJ4g_fkvEg7X_sw0Xd6TC3iFPs_eijx7zVasoHkI2TWBwCoaIqIkQEEUIQaoZBwA3KS_51FIYVnRv8CAp_yyn8N3gOObfTbPQa997jMWxLPStWt3EC2XQ8Fafol9PgTCn0G24CkdE
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Apatent&rft.title=Secondary+system+fault+positioning+method+based+on+improved+Bayesian+algorithm&rft.inventor=YANG+CHAO&rft.inventor=WANG+XIN&rft.inventor=LIU+WENXUE&rft.inventor=LI+CONGCONG&rft.inventor=SHI+FANGFANG&rft.inventor=TANG+YI&rft.inventor=ZHAO+BINCHAO&rft.inventor=LI+NA&rft.inventor=ZHANG+QIANG&rft.inventor=WANG+YONG&rft.inventor=GENG+YUJIE&rft.inventor=LIANG+ZHENGTANG&rft.inventor=SUN+KONGMING&rft.inventor=LIU+MENG&rft.inventor=GUAN+TI&rft.inventor=BAI+YINGWEI&rft.inventor=LI+YUDUN&rft.inventor=TONG+XINYUAN&rft.inventor=SUN+JINGWEN&rft.inventor=ZHANG+GUOHUI&rft.inventor=LI+KUAN&rft.inventor=WANG+YONGBO&rft.date=2021-02-26&rft.externalDBID=A&rft.externalDocID=CN112422324A