Nanocrystalline material detection system

The invention provides a nanocrystalline material detection system. The nanocrystalline material detection system sequentially involves material stripping equipment, carrying equipment, nanocrystalline material detection equipment and discharging equipment from upstream to downstream, wherein the ma...

Full description

Saved in:
Bibliographic Details
Main Authors WEI ZIJIAN, WEN LIUYONG, CAO KUIKANG, XU YIHUA, CAI XIONGFEI, MENG HAI, REN XIAO, ZHOU MING
Format Patent
LanguageChinese
English
Published 25.08.2020
Subjects
Online AccessGet full text

Cover

Loading…
Abstract The invention provides a nanocrystalline material detection system. The nanocrystalline material detection system sequentially involves material stripping equipment, carrying equipment, nanocrystalline material detection equipment and discharging equipment from upstream to downstream, wherein the material stripping equipment is used for stripping incoming materials containing nanocrystalline materials, wherein the incoming materials are a material coil formed by winding sequentially stacked materials of an isolating membrane, the nanocrystalline materials and a base membrane from top to bottom, the carrying equipment is used for carrying the nanocrystalline materials stripped by the material stripping equipment to the nanocrystalline material detection equipment, the nanocrystalline material detection equipment is used for detecting the nanocrystalline materials carried by the carrying equipment, and the discharging equipment is used for discharging the nanocrystalline materials detected by the nanocrystallin
AbstractList The invention provides a nanocrystalline material detection system. The nanocrystalline material detection system sequentially involves material stripping equipment, carrying equipment, nanocrystalline material detection equipment and discharging equipment from upstream to downstream, wherein the material stripping equipment is used for stripping incoming materials containing nanocrystalline materials, wherein the incoming materials are a material coil formed by winding sequentially stacked materials of an isolating membrane, the nanocrystalline materials and a base membrane from top to bottom, the carrying equipment is used for carrying the nanocrystalline materials stripped by the material stripping equipment to the nanocrystalline material detection equipment, the nanocrystalline material detection equipment is used for detecting the nanocrystalline materials carried by the carrying equipment, and the discharging equipment is used for discharging the nanocrystalline materials detected by the nanocrystallin
Author WEI ZIJIAN
REN XIAO
CAI XIONGFEI
WEN LIUYONG
ZHOU MING
CAO KUIKANG
MENG HAI
XU YIHUA
Author_xml – fullname: WEI ZIJIAN
– fullname: WEN LIUYONG
– fullname: CAO KUIKANG
– fullname: XU YIHUA
– fullname: CAI XIONGFEI
– fullname: MENG HAI
– fullname: REN XIAO
– fullname: ZHOU MING
BookMark eNrjYmDJy89L5WTQ9EvMy08uqiwuSczJycxLVchNLEktykzMUUhJLUlNLsnMz1MoBsqm5vIwsKYl5hSn8kJpbgZFN9cQZw_d1IL8-NTigsTk1LzUknhnP0NDQ1NzYyNzU0djYtQAADcYKxc
ContentType Patent
DBID EVB
DatabaseName esp@cenet
DatabaseTitleList
Database_xml – sequence: 1
  dbid: EVB
  name: esp@cenet
  url: http://worldwide.espacenet.com/singleLineSearch?locale=en_EP
  sourceTypes: Open Access Repository
DeliveryMethod fulltext_linktorsrc
Discipline Medicine
Chemistry
Sciences
Physics
DocumentTitleAlternate 纳米晶材料检测系统
ExternalDocumentID CN111573275A
GroupedDBID EVB
ID FETCH-epo_espacenet_CN111573275A3
IEDL.DBID EVB
IngestDate Fri Jul 19 15:21:21 EDT 2024
IsOpenAccess true
IsPeerReviewed false
IsScholarly false
Language Chinese
English
LinkModel DirectLink
MergedId FETCHMERGED-epo_espacenet_CN111573275A3
Notes Application Number: CN202010441497
OpenAccessLink https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20200825&DB=EPODOC&CC=CN&NR=111573275A
ParticipantIDs epo_espacenet_CN111573275A
PublicationCentury 2000
PublicationDate 20200825
PublicationDateYYYYMMDD 2020-08-25
PublicationDate_xml – month: 08
  year: 2020
  text: 20200825
  day: 25
PublicationDecade 2020
PublicationYear 2020
RelatedCompanies TZTEK TECHNOLOGY CO., LTD
RelatedCompanies_xml – name: TZTEK TECHNOLOGY CO., LTD
Score 3.4102488
Snippet The invention provides a nanocrystalline material detection system. The nanocrystalline material detection system sequentially involves material stripping...
SourceID epo
SourceType Open Access Repository
SubjectTerms ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS
CONVEYING
HANDLING THIN OR FILAMENTARY MATERIAL
HANDLING THIN OR FILAMENTARY MATERIAL, e.g. SHEETS, WEBS,CABLES
MACHINES, APPARATUS OR DEVICES FOR, OR METHODS OF, PACKAGINGARTICLES OR MATERIALS
MEASURING
MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE
MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
PACKING
PERFORMING OPERATIONS
PHYSICS
PNEUMATIC TUBE CONVEYORS
SHOP CONVEYOR SYSTEMS
STORING
TARIFF METERING APPARATUS
TESTING
TRANSPORT OR STORAGE DEVICES, e.g. CONVEYORS FOR LOADING ORTIPPING
TRANSPORTING
UNPACKING
Title Nanocrystalline material detection system
URI https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20200825&DB=EPODOC&locale=&CC=CN&NR=111573275A
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwY2BQSTUzSDVPS7PQTbMwT9Q1MQZmxUQT4xRds1Rzy1RghZKYZgDa4OzrZ-YRauIVYRrBxJAF2wsDPie0HHw4IjBHJQPzewm4vC5ADGK5gNdWFusnZQKF8u3dQmxd1KC9YyNwj0fNxcnWNcDfxd9ZzdnZ1tlPzS_I1hB0qIyxkbmpIzMDK7AZbQ7utIU5gXalFCBXKW6CDGwBQNPySoQYmKoyhBk4nWE3rwkzcPhCJ7yFGdjBKzSTi4GC0FxYLMKgCSwS85OLKoENO9CJ2qkKwFYnOCEppKSWgJdW5SlATmgWZVB0cw1x9tAF2h4P92q8sx_CocZiDCx5-XmpEgwKZslJZsB62MwgEdh7SrQ0TTJJSU4E5kRTixTDRAPjFEkGKdzmSOGTlGbgAgUbaJTUyFSGgaWkqDRVFljNliTJgcMHAHXAgSI
link.rule.ids 230,309,783,888,25577,76883
linkProvider European Patent Office
linkToHtml http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV1LT4NAEJ7U-qg3RRutL0wMiQci5bHQAzF2aYNaaGPQ9EYWWKIeaNNijP56h7W1XvS6m-xjst_OY2e-BbjgRON2njtq7thMNQ2EIjONTCXc7nBUKCzXqgLnICT-o3k3tsY1eF3Wwgie0HdBjoiIShHvpbivp6sglidyK-dXyQs2Ta77kespC-9YFx6P4nXd3mjoDalCqUtDJXxw2xWpjKHb1s0arKOJ7QhX6albVaVMf6uU_g5sjHC0otyF2uezBA26_HlNgq1g8eAtwabI0Ezn2LhA4XwPLvFKnKSzDzTsKkZtLqPVKQ6SnPFSpFYV8jdD8z6c93sR9VWcPf7ZakzD1UKNJtSLScEPQCZpQlAPE42h98Q6VmJmKUMkWk7WZpqRHULr73Fa_3WeQcOPgkE8uA3vj2C7EmEVMdWtY6iXszd-giq3TE6FrL4Aq6SEEg
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Apatent&rft.title=Nanocrystalline+material+detection+system&rft.inventor=WEI+ZIJIAN&rft.inventor=WEN+LIUYONG&rft.inventor=CAO+KUIKANG&rft.inventor=XU+YIHUA&rft.inventor=CAI+XIONGFEI&rft.inventor=MENG+HAI&rft.inventor=REN+XIAO&rft.inventor=ZHOU+MING&rft.date=2020-08-25&rft.externalDBID=A&rft.externalDocID=CN111573275A